United Microelectronics Corp.

Kuang-Hung Huang

Po-Jui Liao

Jie-Ning Yang

Yao-Chang Wang

Chi-Sheng Tseng

Shih-Chang Chang

Sheng-Yuan Hsueh

Yi-Chung Sheng

Shih-Chieh Hsu

Po-Cheng Huang

Chih-Kai Kang

Chia-Chen Sun

Chun-Mao Chiou

Chi-Horn Pai

Po-Kuang Hsieh

Chu-Chun Chang

Shu-Hsuan Chih

A semiconductor process includes the following step. A stacked structure is formed on a substrate. A contact etch stop layer is formed to cover the stacked structure and the substrate. A material layer is formed on the substrate and exposes a top part of the contact etch stop layer covering the stacked structure. The top part is redressed.

Semiconductor process

The present invention provides a structure of a resistor comprising: a substrate having an interfacial layer thereon; a resistor trench formed in the interfacial layer; at least a work function metal layer covering the surface of the resistor trench; at least two metal bulks located at two ends of the resistor trench and adjacent to the work function metal layer; and a filler formed between the two metal bulks inside the resistor trench, wherein the metal bulks are direct in contact with the filler.

Resistor and fabrication method thereof

A metal gate process includes the following steps. An isolating layer on a substrate is provided, where the isolating layer has a first recess and a second recess. A first metal layer covering the first recess and the second recess is formed. A material is filled in the first recess but exposing a top part of the first recess. The first metal layer in the top part of the first recess and in the second recess is simultaneously removed. The material is removed. A second metal layer and a metal gate layer in the first recess and the second recess are sequentially filled.

Metal gate process

A manufacturing method of a semiconductor device having metal gate includes providing a substrate having a first semiconductor device, a second semiconductor device, and a first insulating layer covering the first semiconductor device and the second semiconductor device formed thereon, performing an etching process to remove a portion of the first insulating layer to expose a portion of the first semiconductor device and the second semiconductor device, forming a second insulating layer covering the first semiconductor device and the second semiconductor device, performing a first planarization process to remove a portion of the second insulating layer, forming a first gate trench and a second gate trench respectively in the first semiconductor device and the second semiconductor device, and forming a first metal gate and a second metal gate respectively in the first gate trench and the second gate trench.

Semiconductor device having metal gate and manufacturing method thereof

Growing community of inventors

Tainan, Taiwan

Kuang-Hung Huang