General Electric Company

Kriti Sen Sharma

Debashish Pal

Hewei Gao

Various methods and systems for spectral computed tomography imaging are provided. In one embodiment, a method comprises acquiring a first projection dataset and a second projection dataset, detecting a location of metal in the first projection dataset, applying corrections to the first and second projection datasets based on the location of the metal, and displaying an image reconstructed from the corrected first and second projection datasets. In this way, metal artifacts may be substantially reduced in dual or multi-energy CT imaging.

Growing community of inventors

Woburn, MA, United States of America

Kriti Sen Sharma