Texas Instruments Corporation

Krishnasawamy Nagaraj

Abhijit Kumar Das

Paul Kimelman

David A Martin

Steven Craig Bartling

Sudhanshu Khanna

Wei-Yan Shih

Michael Zwerg

Brian Roger Elies

Joonsung Park

Neeraj P Nayak

Baher S Haroun

Ajay Kumar

Indu Prathapan

Amit Kumar Gupta

Sami Kiriaki

Kerry C Glover

Gennady Feygin

Srinivasa Chakravarthy

Christy Leigh She

Srinadh Madhavapeddi

Jan Van Der Spiegel

Frank Zhang

Rahul Bhandarkar

Abhijit Kurmar Das

Sameer Sonkusale

Methods for operating two or more analog-to-digital converters (ADCs) are presented herein. The method may be implemented in an integrated circuit. The integrated circuit may include a first ADC and a second ADC disposed on a single semiconductor die. The integrated circuit may also include logic circuitry operably coupled to the first and second ADCs. For a digital value obtained by conversion, by the first ADC, of a first analog signal sampled by the first ADC during a period of time overlapping with another period of time during which a second analog signal is being converted by the second ADC, the logic circuitry may be configured to cause the digital value to be marked as noisy.

Analog-to-digital convertors positioned on a single semiconductor die

In described examples, each node between adjacent capacitive elements of a stack of series-coupled capacitive elements is biased during a reset mode, where each of the capacitive elements includes piezoelectric material. A strain-induced voltage is generated across each of the capacitive elements. Each of the strain-induced voltages is combined to generate a piezoelectric-responsive output signal during a sensing mode at a time different from the time of the reset mode.

Piezo-electric sensor reset

A capacitive sensing system includes a controller, a node connected to one side of a capacitance, the controller configured to measure the capacitance by measuring a time for a voltage across the capacitance to reach a predetermined reference voltage, a noise measurement circuit configured to measure electrical noise on the node, and the controller receiving the measurement of noise from the noise measurement circuit.

Capacitive sensing

An improved differential sensor and corresponding apparatus implementing same. The differential sensor includes a substrate, an amplifier coupled to the substrate, and a plurality of highly-matched piezoelectric capacitors formed onto the substrate. A first set of the highly-matched piezoelectric capacitors are electrically coupled to a non-inverting input of the amplifier, and a second set of the highly-matched piezoelectric capacitors are electrically coupled to an inverting input of the amplifier to form an open loop differential amplifier.

Differential sensor using thin-film piezoelectric capacitors

A system includes a controller, a node connected to one side of a capacitance, the controller configured to measure the capacitance by measuring a time for a voltage across the capacitance to reach a predetermined reference voltage, and the controller causing the time period for capacitance measurements to vary even when the capacitance is constant.

A capacitive sensing system includes a controller, a node connected to one side of a capacitance, the controller configured to measure the capacitance by measuring a time for a voltage across the capacitance to reach a predetermined reference voltage, and the controller causing the time period for capacitance measurements to vary even when the capacitance is constant.

A phase detector includes a counter to generate the integer portion of a number of complete cycles of an output clock at each active edge of a reference clock. A time to digital converter in the phase detector generates the fractional portion of the number of complete cycles of the output clock at each active edge of the reference clock. The sum of the fractional portion and the integer portion is subtracted from an accumulated value obtained by accumulating a pre-determined number to generate an error signal as the output of the phase detector. The counter is read at an active edge of one of two re-timed clocks derived from the reference clock. Each of the two re-timed clocks is generated based on a comparison of the fractional portion with a pair of thresholds. Errors due to metastability in reading the counter are thereby avoided.

IC phase detector with re-timed reference clock controlling switches

A system for tuning an oscillator frequency. The system includes a trimmed calibration circuit comprising a comparator and trimmed delay element and calibration logic. The calibration logic is configured to receive an output of the comparator and control an on time and an off time of an oscillator based on the output of the comparator.

Systems and methods for tuning an oscillator frequency

A phased-locked loop (PLL) circuit which comprises a phase-frequency detector (PFD) configured to receive a reference signal, a voltage-controlled oscillator (VCO) configured to produce a VCO signal, and a divider configured to divide the VCO signal thereby producing a feedback signal based on the feedback signal not being locked to the reference signal. Based on the feedback signal not being locked to the reference signal, the PFD is configured to compare an edge of the reference signal with an edge of the feedback signal to produce an error signal. Based on the feedback signal being locked to the reference signal, the PFD is configured to compare the edge of the reference signal to an edge of the VCO signal to produce an error signal and the divider is configured to be disabled.

System and method for reducing power consumption in a phased-locked loop circuit

A method for converting an analog signal to a digital signal is provided. Initially, a digital representation of a portion of an analog signal is generated. Residue of the analog signal is then sampled at a sampling instant so as to generate a residue sample. A signal having a frequency that is proportional to the voltage of the residue sample is generated, and the signal is measured to generate coarse and fine measurements of the frequency. A digital representation of the residue sample from the coarse and fine measurements is then generated.

Pipelined ADC with a VCO-based stage

A singled-ended, successive approximation register analog-to-digital converter convert an analog input voltage to a digital representation comprising m upper order bits and a number of lower order bits. The SAR ADC comprises SAR logic, a resistive network, multiple switches, and first and second LSB capacitors. The switches also comprises two sets of switches coupled to the resistive network, each set of switches is configured to couple a selected tap to each of the first and second LSB capacitors. When determining the lower order bits, the SAR logic is configured to control the sets of switches to change the first and second taps from one cycle in which one of the lower order bits is determined to a next cycle in which the next of the lower order bits is determined so that the voltage of both taps changes by a decreasing amount with each succeeding bit being determined.

High speed resistor-DAC for SAR DAC

A device is provided for dividing a clock signal by even and odd integers. The device includes a divider, a delay portion and a duty cycle corrector. The divider is arranged to receive the clock signal and can divide the clock signal and output a divided clock signal. The delay portion can output a delayed signal based on the divided clock signal. The duty cycle corrector can output a first signal based on the delayed signal and the divided clock signal.

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Plano, TX, United States of America

Krishnasawamy Nagaraj