Sensors Unlimited

Amplification Technologies, Inc.

Inphot, Inc.

Krishna Linga

John Liobe

Michael J Evans

Michael Delamere

Ranjit Pandher

A system for aligning components of an imaging device includes an imaging device, and a test camera. The imaging device includes a lens and a focal plane array (FPA). The FPA defines an optical axis and includes at least two test elements configured and adapted to emit a light through the lens. The test camera is configured and adapted to be mounted to and pre-aligned with the lens of the imaging device to receive a light from the at least two test elements.

Systems and methods for aligning imaging devices

A system and method providing for the detection of an input signal, either optical or electrical, by using a single independent discrete amplifier or by distributing the input signal into independent signal components that are independently amplified. The input signal can either be the result of photoabsorption process in the wavelengths greater than 950 nm or a low-level electrical signal. The discrete amplifier is an avalanche amplifier operable in a non-gated mode while biased in or above the breakdown region, and includes a composite dielectric feedback layer monolithically integrated with input signal detection and amplification semiconductor layers.

Low-level signal detection by semiconductor avalanche amplification

A diamond based Blue/UV light emitting source is disclosed. The source includes a diamond substrate having a first conductivity type, a first aluminum gallium nitride layer above the diamond substrate having the same conductivity type as the substrate, a bulk or a quantum well structure on the AlGaN layer formed of a plurality of repeating sets of alternating layers selected from among GaN, InGaN, and AlInGaN, a second AlGaN layer on the quantum well or the bulk active layer having the opposite conductivity type as the first AlGaN layer, a contact structure on the second AlGaN layer having the opposite conductivity type from the substrate and the first AlGaN layer, an ohmic contact to the diamond substrate, and an ohmic contact to the contact structure.

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Plainsboro, NJ, United States of America

Krishna Linga