Baida USA LLC

Krishna Elango

Davy Huang

Xu Zhou

A method for testing peripheral component interconnect express (PCIe) devices is provided. The method implemented at a PCIe testing system detects that one or more PCIe devices have been inserted into one or more PCIe buses of a data processing system. In response to the detection, the PCIe testing system scans all PCIe buses of the data processing system to discover the one or more PCIe devices. For each of the PCIe devices discovered, the PCIe testing system repairs and retrains a PCIe link associated with the PCIe device, without rebooting the data processing system. The PCIe testing system loads a device driver instance for the PCIe device to be hosted by an operating system. The PCIe testing system then executes a test routine to concurrently test the one or more PCIe devices via the respective device driver instances.

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San Ramon, CA, United States of America

Krishna Elango