Oracle America, Inc.

Krishna B Rajan

Ishwardutt Parulkar

Gaurav Agarwal

Paul J Dickinson

Sriram Anandakumar

A method and apparatus for testing a three dimensional (3D) memory including a static array and an active array. The method is performed by a memory built-in self-test (MBIST) controller, and includes writing data to the static array, transferring data from the static array to the active array, and reading data from the active array. The method further includes, in a plurality of subsequent cycles, writing data to the static array; transferring data from static array to the active array, and reading data from the active array, wherein said writing data for each subsequent cycle is performed concurrently with reading data for a previous cycle.

Built-in self-test of 3-dimensional semiconductor memory arrays

A method and system for testing a chip at functional (operational) speed. The chip may include an integrated circuit having a number flops and memory arrays arranged into logically functioning elements. Additional flops may be included to output to one or more of the other flops in order to provide inputs to the flops at the functional speed such that the receiving flops executing at the functional speed according to the received input at a next functional clock pulse to facilitate testing the chip at the functional speed.

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Fremont, CA, United States of America

Krishna B Rajan