Intel Corporation

Kris Kaufman

David B Harnishfeger

Merit Y Hong

A temperature measurement system is disclosed. In accordance with some embodiments of the present disclosure, a temperature measurement system may comprise a resistor, a thermistor, a resistance-to-current converter configured to generate a current signal based on a resistance, an analog-to-digital converter (ADC) configured to receive a first current signal based on the resistor, convert the first current signal into a first digital signal, receive a second current signal based on the thermistor, and convert the second current signal into a second digital signal, and a calculation stage communicatively coupled to an ADC output and configured to determine a first digital value based on the first digital signal, determine a second digital value based on the second digital signal, calculate a resistance ratio based on the first digital value and the second digital value, and determine a temperature output value based on the resistance ratio.

Temperature measurement system

In accordance with some embodiments of the present disclosure, a calibrated temperature measurement system comprises a resistor, a thermistor, a resistance-to-current converter configured to generate a current signal based on a resistance, and an analog-to-digital converter (ADC) configured to receive a first current signal based on the resistor, convert the first current signal into a first digital signal, receive a second current signal based on the thermistor, and convert the second current signal into a second digital signal. A memory may comprise resistor-characterization information. A calculation stage communicatively coupled to an ADC output may be configured to determine a first digital value based on the first digital signal, determine a second digital value based on the second digital signal, calculate a resistance ratio based on the first digital value and the second digital value, and determine a temperature output value based on the resistance ratio and the resistor-characterization information.

Calibrated temperature measurement system

A temperature-measurement input stage may include a resistor, a thermistor, a first multiplexor, an amplifier, a second multiplexor, and an output stage. The first multiplexor may be configured to couple the resistor to a first amplifier input during a first multiplexor state, and couple the thermistor to the first amplifier input during a second multiplexor state. The amplifier may comprise the first amplifier input, a second amplifier input coupled to a voltage reference, and an amplifier output coupled to a feedback path. The second multiplexor may be configured to route a feedback current to the resistor during the first multiplexor state and route the feedback current to the thermistor during the second multiplexor state. The output stage may be configured to provide an output current based on the feedback current.

Input stage for temperature measurement system

A method may include measuring a frequency difference between an actual frequency and an expected frequency associated with a frequency control calibration signal value for each of a plurality of frequency control calibration signal values during a calibration phase. The method may additionally include generating integral non-linearity compensation values based on the frequency differences measured. The method may further include generating the applied frequency control signal based on a frequency control calibration signal value received by the digital-to-analog converter during the calibration phase. The method may also include generating a compensated frequency control signal value based on a frequency control signal value received by the integral non-linearity compensation module and an integral non-linearity compensation value associated with the frequency control signal value during an operation phase of the wireless communication element.

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Gilbert, AZ, United States of America

Kris Kaufman