Agilent Technologies, Inc.

Hewlett-Packard Company

Kris J Kanack

Robert A Slutz

Tracy L Sayre

Ronald K Kerschner

Stephen J Cook

James M Hayes

Stig Oresjo

Horst Mueller

Sunit Bhalla

An X-ray collimator formed of stacked laminated layers with apertures therein aligned to form complex 3-dimensional collimator structures, and method of fabrication thereof, is presented.

Fine geometry X-ray collimator and construction method

An improved circuit board inspection system incorporates a technique that confirms observed electrical connection defects. The improved circuit board inspection system applies a localized investigative routine upon portions of a printed circuit board having one or more identified defects. The technique accounts for the slope of a portion under test of the printed circuit board and provides results that are more accurate from inspection systems that report electrical connection defects.

System and method for confirming electrical connection defects

A test fixture for electrically connecting a limited-access test target on a loaded circuit board with an interface probe of a tester may comprise an elongate test probe having a first end and a second end and a wireless interface printed circuit board having a first side and a second side. The first end of the elongate test probe is substantially aligned with the limited-access target on the loaded circuit board when the test fixture is positioned adjacent the loaded circuit board. A contact pad on the first side of the wireless interface printed circuit board is substantially aligned with the elongate test probe so that the contact pad contacts the second end of the elongate test probe. A contact target on the second side of the wireless interface printed circuit board is electrically connected to the contact pad on the first side of the wireless interface printed circuit board. The contact target contacts the interface probe of the tester when the test fixture is mounted on the tester.

Loaded-board, guided-probe test fixture

A test fixture for electrically connecting a plurality of limited-access test targets on a loaded circuit board with a plurality of interface probes of a tester may comprise a plurality of elongate test probes, a universal interface plate (UIP), and a wireless interface printed circuit board (WIPCB). A first end of each elongate test probe is substantially aligned with a limited-access target on the loaded circuit board when the test fixture is positioned adjacent the loaded circuit board. Each of a plurality of double-headed spring probes mounted to the UIP has a first spring loaded head located at its first end and a second spring loaded head located at its second end. Each double-headed spring probe is generally axially aligned with an elongate test probe so that its first spring loaded head contacts a second end of the corresponding elongate test probe. Each of a plurality of contact pads on the first side of the WIPCB is substantially aligned with a double-headed spring probe so that each contact pad contacts the second spring loaded head of the corresponding double-headed spring probe. Each of a plurality of contact targets on the second side of the WIPCB is electrically connected to a contact pad on the first side of the WIPCB and contacts an interface probe of the tester when the test fixture is mounted on the tester.

A test fixture for electrically connecting a limited-access test target on a loaded circuit board with an interface probe of a tester may comprise an elongate test probe having a first end and a second end and a probe-mounting plate having a first side and a second side. The first end of the elongate test probe is substantially aligned with the limited-access target on the loaded circuit board when the test fixture is positioned adjacent the loaded circuit board. A larger-pitch target on the first side of the probe-mounting plate is substantially aligned with the elongate test probe so that the larger-pitch target contacts the second end of the elongate test probe. A personality pin having a first end and a second end is mounted to the second side of the probe-mounting plate. The personality pin contacts the interface probe of the tester when the test fixture is mounted on the tester. A first end of an elongate wire is attached to the larger-pitch target. A second end of the elongate wire is attached to the first end of the personality pin. The elongate wire electrically connects the personality pin to the larger-pitch target.

A test fixture for electrically connecting a limited-access test target on a loaded-circuit board with an interface probe of a tester may comprise a solid, elongate test probe having a first end and a second end. A double-headed spring probe having a first spring loaded head located at a first end of the double-headed spring probe and a second spring loaded head located at a second end of the double-headed spring probe is generally axially aligned with the solid, elongate test probe so that the first spring loaded head contacts the second end of the solid, elongate test probe. A contact pad on a first side of a wireless interface printed circuit board is generally aligned with the second spring loaded head of the double-headed spring probe so that the contact pad contacts the second spring loaded head of the double-headed spring probe. A contact target on a second side of the wireless interface printed circuit board is electrically connected to the contact pad on the first side of the wireless interface printed circuit board and contacts the interface probe of the tester when the test fixture is mounted on the tester.

A guided-probe test fixture is disclosed for connecting circuit cards having electronic components to a board test system. The test fixture utilizes long, leaning or vertical test probes, guide plates and limited probe tip travel in order to achieve high-accuracy, fine-pitch probing of limited-access, no-clean test targets. The guided-probe test fixture of the present invention also utilizes spring probes, probe-mounting plates, personality pins and an alignment plate in order to couple test targets with multiplexed tester resources. The guided-probe test fixture of the present invention may also utilize a universal interface plate with double-headed spring probes and/or a wireless interface printed circuit board to facilitate the electrical coupling of test targets to tester resources. Accordingly, the guided-probe test fixture of the present invention is capable of sophisticated in-circuit and functional testing of a loaded-printed circuit board containing both standard-access and limited-access, no-clean test targets. The present invention is also capable of improved probing accuracy, improved no-clean testability and improved fine-pitch probing of limited-access test targets, while at the same time capable of probing standard-access test targets.

A board alignment system is provided for a printed circuit board test system wherein at least two spring biased alignment pins have body portions and first and second ends and the second end is tapered to a diameter smaller than the diameter of the body portion. A printed circuit board to be aligned has alignment holes having a diameter larger than the smaller diameter and smaller than the diameter of the body portion.

Board alignment system

A fixture is disclosed for connecting circuit cards having electronic components to a board test system. The fixture is vacuum actuated. The test fixture comprises a fixture base and a support assembly. The fixture base comprises a board test system interface, supports, probe plate and electrical connections. The probe plate contains an integral vacuum chamber with molded supports. The support assembly comprises a first seal, a support plate, a second seal, and a third seal. The circuit card is positioned by two tooling pins located in the probe assembly. The card is electrically connected to the test system through a probe, connecting wire, and a scanner pin. Two new seals are disclosed.

Growing community of inventors

Loveland, CO, United States of America

Kris J Kanack