The University of Tokyo

Kousuke Ooe

Naoya Shibata

Yuichi Ikuhara

Takehito Seki

An observation method using a scanning transmission electron microscope for scanning an electron beam over a specimen and detecting electrons transmitted through the specimen includes: acquiring results of detecting the electrons transmitted through the specimen using a segmented detector having detection regions disposed in a bright-field area; and generating segmented images based on the results of detecting the electrons in the detection regions, and applying filters determined based on a signal-to-noise ratio to the segmented images to generate a reconstructed image. The signal-to-noise ratio is proportional to an absolute value of a total phase contrast transfer function normalized by a noise level, the total phase contrast transfer function being defined by product-sum operation of phase contrast transfer functions expressed by complex numbers and weight coefficients for the detection regions. The filters for the detection regions are determined based on the weight coefficients that yield a maximum of the signal-to-noise ratio.

Observation method by means of scanning transmission electron microscope, scanning transmission electron microscope system, and computer readable medium

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Tokyo, Japan

Kousuke Ooe