Konica Minolta, Inc.

Konica Minolta Opto, Inc.

Minolta Company, Ltd.

Konica-Minolta Holdings, Inc.

Tohoku University

Spin Sensing Factory Corp.

Japan Science and Technology Agency

Koujirou Sekine

Mitsuru Yokoyama

Takuji Hatano

Masaaki Tsuchida

Hiroaki Ueda

Manami Kuiseko

Kyu Takada

Hiroshi Hatano

Naoki Nishida

Junichi Jono

Koji Takahara

Miyuki Teramoto

Kou Osawa

Kenji Konno

Shigeto Ohmori

Shinji Maruyama

Yasuo Ando

Mikihiko Oogane

Yusuke Hirao

Masahiro Okitsu

Kosuke Fujiwara

Naoki Kimura

Susumu Noda

Kazumi Furuta

Yukihiro Ozeki

Eiji Miyai

Tsuyoshi Iwamoto

Koji Horii

Tsukasa Yagi

Naoki Mitsugi

Masahiro Imada

A non-destructive inspection method of inspecting an inspection target using multiple different types of non-destructive inspection means that include one non-destructive inspection means and at least one other non-destructive inspection means. The method includes determining a marking position on the inspection target in a detection result by the one non-destructive inspection means, causing a device to store the marking position, and fixedly forming a mark on the inspection target corresponding to the marking position. The mark is detectable by the other non-destructive inspection means. The method further includes causing the other non-destructive inspection means to inspect an inspection target including the mark. The method further includes contrasting detection results by the multiple different types of non-destructive inspection means in reference to the mark which is the marking position.

Non-destructive inspection method

A magnetic sensor includes a plurality of magnetoresistive element units. Each of the magnetoresistive element units includes a flat-surface-type first magnetoresistive element having a detection axis in a first direction and a flat-surface-type second magnetoresistive element having a detection axis in a second direction different from the first direction. The first magnetoresistive element and the second magnetoresistive element are arranged so as to face each other. The plurality of magnetoresistive element units are arrayed in a direction orthogonal to flat surfaces of the first magnetoresistive element and the second magnetoresistive element. The surfaces facing a measurement sample constitute a surface parallel to the direction in which the magnetoresistive element units are arrayed.

Magnetic sensor

Provided is a production method for a magnetoresistive element including treating a stacked layer into a predetermined shape. The stacked layer includes a magnetoresistive layer whose resistance changes depending on a magnetic field and a cap layer above the magnetoresistive layer and having a thickness in a range of 10 nm to 60 nm. The method further includes covering and protecting the stacked layer with an insulating layer, forming an opening in the insulating layer by reactive etching and exposing a surface of the cap layer at the opening, etching the cap layer in a range less than a total thickness of the cap layer by ion milling of the surface, and depositing an upper layer to be a part of the magnetoresistive element. The upper layer is in contact with the surface of the cap layer after the etching.

Magnetoresistive element, and production method for magnetoresistive element

A method for producing a tunnel magnetoresistive element includes a stacking step, then in-magnetic field heating, and then dry etching. The stacking includes stacking a B absorption layer which is in contact with an upper surface of a CoFeB layer. The dry etching includes removal of layers to the B absorption layer. An end of etching is set as an end point time detected by an analysis device when a final layer before the B absorption layer directly above the CoFeB layer is exposed has reduced to a prescribed level, or when the B absorption layer directly above the CoFeB layer has increased to the prescribed level. An amount of over-etching after the end point time is specified in advance, and the B absorption layer is stacked such that the thickness from the prescribed level to the upper surface of the CoFeB layer corresponds to the over-etching amount.

Method for producing tunnel magnetoresistive element

Provided is an electroluminescent device that emits light of a single color and includes a plurality of functional layers, in which an absorption peak is included in the emission wavelength and at least one absorption peak is included in a complementary color region of an emission wavelength in the range of 380 nm to 780 nm, an absolute value of a deviation (&#x394;uv) of a color coordinate of front reflected light at the time of white color illumination from a blackbody locus is below 0.02, and a refractive index and a film thickness of each of the plurality of functional layers are determined to satisfy the formula D(&#x3b8;)&#x2265;D(0)cos &#x3b8; (0&#x2264;&#x3b8;&#x2264;&#x3b8;&#x2264;60 degrees) when an angle dependence of emission intensity is defined as D(&#x3b8;).

Electroluminescent device capable of preventing coloration of front reflected light

A method of designing an electroluminescent device includes preparing a reference device including a construction of an electroluminescent device and a desired analyzed device including a construction of an electroluminescent device, performing quantum optical analysis, electromagnetic field analysis, and ray trace with thicknesses and complex relative permittivities of a first transparent member, a first electrode, a first functional layer, a second functional layer, an emissive layer, and a second electrode as well as a position of a light-emitting point in the emissive layer and a distribution of light-emitting points in the emissive layer being used as design variables, calculating a 'ratio of light extraction efficiency' between the reference device and the analyzed device by computing efficiency of light extraction from the emissive layer into the transparent member or air in both of the reference device and the analyzed device, finding relation of the thickness and the complex relative permittivity of each layer forming the reference device and the analyzed device with the 'ratio of light extraction efficiency,' and obtaining thicknesses and complex relative permittivities of the first transparent member, the first electrode, the first functional layer, the second functional layer, the emissive layer, and the second electrode as the design variables, based on the relation and an electroluminescence spectrum in air and the first transparent member measured by feeding a current to the reference device.

Method of designing electroluminescent device, electroluminescent device manufactured with the design method, and method of manufacturing electroluminescent device with the design method

A surface-emitting unit includes a surface-emitting panel which emits light, a transmissive member which is arranged to face a light-emitting surface, propagates light emitted from the surface-emitting panel as being reflected therein, and allows light to exit from a light exit surface, and a scattering sheet which is provided to face a light exit surface of the transmissive member and scatters light. The transmissive member has a dimming surface provided between a light incident surface on which light emitted from the surface-emitting panel is incident and the light exit surface. The light-emitting surface has a light-emitting region which emits light and a non-light-emitting region which does not emit light. The dimming surface is configured such that a region facing the non-light-emitting region is different in transmittance of light from a region facing the light-emitting region, in accordance with a distribution of light emitted from each of the surface-emitting panels.

Surface-emitting unit having dimming regions

A method of designing an electroluminescent device allows more accurate computation of an external emission spectrum output to the outside in a current injection state and accurate estimate of a quantity and/or a color of light extracted to the outside, an electroluminescent device manufactured with the design method, and a method of manufacturing an electroluminescent device with the design method.

A planar light-emitting unit includes a light emission region and a non-light emission region located in an outer periphery of the light emission region. A non-space region is provided between a light guide member and a diffusion member in a region corresponding to the non-light emission region such that a space is formed in a region corresponding to the light emission region between the light guide member and the diffusion member. The non-space region includes a protruding region extending to the light emission region from the non-light emission region, and a conditional expression 0&#x3c;&#x394;&#x2266;2d&#xd7;tan &#x3b8; is fulfilled, where &#x394; is a protruding amount (mm) from the non-light emission region of the non-space region, d is a thickness (mm) of the light guide member, and &#x3b8; is a total reflection critical angle between the light guide member and air.

Planar light-emitting unit

A surface light emitting element includes a light emitting layer that emits light, a first electrode layer that is provided on the side of the light emitting layer from which the light is extracted and allows the light that has been emitted by the light emitting layer to pass through, a second electrode layer that is provided on the side of the light emitting layer from which light is not extracted, a light scattering layer that is provided on the side of the first electrode layer opposite to the side on which the light emitting layer is positioned, and a transparent substrate that is provided on the side of the light scattering layer opposite to the side on which the light emitting layer is positioned, wherein a conductive material in which the real part of a complex dielectric constant is negative is used in the first electrode layer.

Surface light emitting element

An organic light-emitting element including an organic light-emitting layer, a transparent substrate, and a transparent electrode disposed between the organic light-emitting layer and the transparent substrate; and which treats the surface of the transparent substrate on the opposite side from the transparent electrode as a light-extraction surface. The transparent substrate has birefringence, and has a refraction index of a P polarized light that is less than a refraction index of an S polarized light. A polarized light wherein an oscillation direction of an electric field is parallel to a laminated surface of the light-emitting layer is designated S polarized light, and a polarized light that includes a vector of the direction of the progression of the light and in which the oscillation direction of the electric field is included in a plane perpendicular to the laminated surface is designated P polarized light.

Organic light-emitting element

Disclosed is a deflection optical element, which makes it possible to deflect an incident light so as to couple the incident light to an optical element disposed in the later stage without deteriorating the optical efficiency. The deflection optical element, which deflects an incident light coming along a first optical axis at a deflection surface and emits an emission light propagating along a second optical axis so as to couple the emission light to either a diffraction grating or a refracting optical system, comprises at least one diffracting surface and at least one reflecting surface, wherein the angle &#x3b8;n, an angle &#x3b8;t derived as a total diffraction angle caused by the at least one diffracting surface, and an angle &#x3b8;a, which is formed at a second intersection of the first optical axis and the second optical axis, fulfill a conditional relationship of:0&#x2266;&#x3b8;

Deflection optical element, optical recording head and optical recording apparatus

An optical recording head includes: a light source; a slider comprising a wave guide which irradiates light from the light source to a recording medium, wherein a grating coupler is formed on an end portion at an opposite side of the waveguide relative to the light source; and an optical element which comprises a diffraction grating and introduces the light from the light source to the grating coupler through the diffraction grating. The optical element deflects the light from the light source so that the light is incident into the grating coupler with a deflection angle larger than 90 degrees with respect to a direction in which the light proceeds when the light is incident into the optical element.

Optical recording head and optical recording apparatus

Provided is an optical recording head in which a light beam from a light source is collected by an optical element and reflected on a reflecting surface to be formed into a spot light. Since a support portion for supporting the light source of the optical element at a predetermined position and the reflection surface for reflecting the light beam are formed integrally with each other, it is not required to perform the positioning thereof, and light can be collected to a very small spot with high efficiency, and an optical recording head and an optical recording apparatus having low heights can be provided.

Provided are an optical device, optically assisted magnetic recording head and optically assisted magnetic recording apparatus that effectively emit the introduced light, from the apex portion of a waveguide. The optical device includes: an optical element having a substantially parabolic outline which contains a side surface and the apex portion with a light-emitting surface; a light guiding unit for forming a light spot on the core layer; and a light introducing section provided on the core layer at the position at which the light spot is formed. The light introduced into the core layer travels substantially parallel to the axis of the parabola, and is reflected by the side surface so as to be converged at the focal point of the parabola and is then emitted from the apex portion. The position of the point where the light intensity is greatest in the light spot is deviated from the axis.

Optical device, optically heat assisted magnetic recording head and optically heat assisted magnetic recording apparatus, having intensity point deviated from axis of the core

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Ibaraki, Japan

Koujirou Sekine