Fujitsu Corporation

Fujitsu Semiconductor Limited

Kouji Uesaka

Taizan Kobayashi

Eiji Takada

Shuichi Kameyama

Katsuki Shirai

Yuichi Watanabe

Yuushin Kimura

Shigeru Goto

Yasuhiko Tandou

Takeshi Yanase

Kiyotaka Shinada

Reizo Nakamura

An information processing apparatus includes: a memory configured to store data generated in a manufacturing line where a product is manufactured in a state in which the data is linked to information in a tree structure in which elements related to manufacture of the product assigned as nodes; and a processor configured to: determine, when data of a prototype is stored to the memory, whether information of an element out of the elements corresponding to an uppermost node out of the nodes is linked to the data of the prototype; link, when the information of the element corresponding to the uppermost node is not linked, as the information of the element corresponding to the uppermost node of the data of the prototype, information distinguishable from information of the element corresponding to the uppermost node linked to the data of the product; and store the data of the prototype.

Information processing apparatus, information processing method, and recording medium recording information processing program

A displacement measurement device includes a plurality of light receiving elements each of which outputs a signal corresponding to illuminance of interference fringe, the elements being arranged in a range of two periods of the interference fringe and arranged with an interval based on the period of the interference fringe in a movement direction of the interference fringe, a differential processing unit configured to perform differential processing on predetermined combinations of the signals output from the elements to generate four signals, a phase calculation unit configured to calculate a phase of the interference fringe on the basis of the signals output from the elements; and an output signal selection unit configured to select two signals from among the four signals on the basis of the phase of the interference fringe and select a signal of which absolute value is larger from among the two selected signals.

Displacement measurement device, displacement measurement method, and displacement measurement program

A signal processing section included in a semiconductor testing circuit supplies a test signal inputted from a tester via a signal line to a plurality of DUTs and generates a test result by synthesizing response signals transmitted from the plurality of DUTs on the basis of the test signal. A test result output section included in the semiconductor testing circuit makes a voltage level of the test result differ from a voltage level of the test signal inputted and outputs the test result to the tester via the signal line.

Semiconductor testing circuit, semiconductor testing jig, semiconductor testing apparatus, and semiconductor testing method

A test system for circuits which is capable of selecting any one of a plurality of circuits to be tested and testing a selected circuit to be tested, includes a tested circuit data producing unit which produces tested circuit data concerning any one of several circuits to be tested; and a control unit which controls a plurality of programmable gate arrays (PGAs) on the basis of an output of the tested circuit data producing unit. Furthermore, the test system for circuits includes a plurality of PGAs each of which is connected to the control unit and generates a test pattern in response to control data sent from the control unit according to a program; and interface units which are associated with the plurality of PGAS, respectively, and are connected to the circuits to be tested.

Test system for circuits

Growing community of inventors

Kawasaki, Japan

Kouji Uesaka