Mitsubishi Heavy Industries Limited

Kouji Satake

Satoshi Sakai

Hideo Yamakoshi

Saneyuki Goya

Shintaro Kumano

Toshiya Watanabe

Nobuhiko Nishimura

Mayumi Saito

Fumitoshi Sakata

Youji Nakano

Atsuhiro Iyomasa

Toshiaki Monaka

A method for trouble managing in equipment is provided, with which optimal timing of repairing the equipment and occurrence of malfunction probable to occur concurrently with present malfunction or later stage can be inferred with sufficient accuracy, and which can be adopted for large-scale equipment used in a plant. The method for trouble managing of equipment by monitoring operation condition of the equipment with a monitoring means and inferring cause of malfunction of the equipment by an inference means which infers the cause of the malfunction using measured data concerning the operation condition obtained by the monitoring means when malfunctions occur as nodes of the inference means, comprises selecting acoustic data most similar to sound emitted from the equipment in which malfunction has occurred from among a plurality of acoustic data provide beforehand, selecting morphologic data most similar to a pattern of operating condition in the equipment from among a plurality of morphologic data provide beforehand, adding the selected acoustic data and the selected morphologic data to the nodes, and performing inference of cause of the malfunction of the equipment by a first Bayesian network base on the nodes.

Method for trouble managing of equipment

A photovoltaic device having a high conversion efficiency is produced in a stable manner. The conditions for film deposition of a microcrystalline silicon photovoltaic layer () in a photovoltaic device are set based on the Raman peak ratio within a Raman spectrum obtained at the substrate () side of the microcrystalline silicon layer (), and the Raman peak ratio within a Raman spectrum obtained at the opposite side to the substrate ().

Method of setting conditions for film deposition, photovoltaic device, and production process, production apparatus and test method for same

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Takasago, Japan

Kouji Satake