Adv Antest Corporation

Kouji Miyauchi

Go Utamaru

Kotaro Hasegawa

Toshiyuki Watanabe

Norio Kobayashi

Hideki Shirasu

A test apparatus includes: an electrical connection unit to be electrically connected to a terminal of each of a plurality of light emitting devices to be tested; a light source unit for collectively irradiating the plurality of light emitting devices with light; a measuring unit for measuring a photoelectric signal obtained by photoelectrically converting light irradiated by the light source unit and output via the electrical connection unit by each light emitting device; an acquisition unit for acquiring a correction map including a correction value for correcting a variation in intensity of light with which a position of each light emitting device is irradiated by the light source unit; and a determination unit for determining a quality of each light emitting device on a basis of a measurement result by the measuring unit and the correction map acquired by the acquisition unit.

Test apparatus, test method, and computer-readable storage medium

A test apparatus includes: an electrical connection unit configured to be electrically connected to a light emitting device panel having a plurality of cells each including a light emitting device and arranged in a row direction and a column direction; a light source unit configured to collectively irradiate the plurality of cells with light; a reading unit configured to read, for each row of the light emitting device panel, a photoelectric signal obtained by photoelectrically converting the light in each of two or more of the cells arranged in the column direction by the light emitting device; a measuring unit configured to measure a photoelectric signal read from each of the plurality of cells; and a determination unit configured to determine a quality of each of the plurality of cells on a basis of a measurement result of the measuring unit.

A test apparatus includes: an electrical connection unit electrically connected to a terminal of each of a plurality of light emitting devices to be tested; a light source unit for collectively irradiating the plurality of light emitting devices with light; an electrical measurement unit for measuring a photoelectric signal obtained by photoelectrically converting the light irradiated from the light source unit by each light emitting device; a light emission control unit for causing at least one light emitting device to be subjected to light emission processing to emit light; a light measuring unit for measuring light emitted by the at least one light emitting device to be subjected to the light emission processing; and a determination unit determining a quality of each light emitting device on the basis of a measurement result of the electrical measurement unit and a measurement result of the light measuring unit.

A test apparatus includes an electrical connection unit electrically connected to respective terminal of each of a plurality of LEDs to be tested, a light source unit which collectively irradiates the plurality of LEDs with light, a measuring unit which measures a photoelectric signal that each of the plurality of LEDs outputs via the electrical connection unit after photoelectrically converting the light with which the light source unit irradiates the plurality of LEDs, and a determination unit which determines pass or fail of each of the plurality of LEDs based on the measurement results by the measuring unit.

Test apparatus for determining pass or fail of LEDs, test method and computer-readable medium

In a PLL circuit, an oscillation frequency is quickly and accurately locked to a target frequency. There is provided a PLL circuit, including a VCO that controls the frequency of an output signal according to a voltage of an input signal, a loop divider that divides the frequency of a signal, which is acquired by causing a mixer to mix a local signal generated by a local oscillator and the output signal with each other, by N, and a reference frequency divider that divides the frequency of a reference signal, which is output by a reference signal oscillator, by R. Also provided is a phase comparator that outputs a signal according to a difference in phase between an output of the loop divider and an output of the reference frequency divider, a loop filter that passes low frequency components, and supplies the VCO with the low frequency components, a subtractor that outputs a difference between a voltage of the input signal to be supplied to the VCO so that the frequency coincides with a target value and the output of the loop filter, and switches that supply the loop filter with the output of the phase comparator or the output of the subtractor.

Phase locked loop circuit that locks the oscillation frequency to a target frequency

Provided is a test system that tests a device under test, the test system including: a test head that includes a test module that generates a test signal to be supplied to the device under test; a performance board that is mounted above the test head and conveys the test signal generated by the test module; and a daughter unit that is detachably mounted to the performance board, and conveys the test signal from the performance board to the device under test, where the daughter unit includes: a socket to which the device under test is mounted; a daughter board to which the socket is mounted; and an enclosure that accommodates therein the socket and the daughter board, and includes a daughter-unit shield that cuts off noise from outside with respect to the socket and the daughter board.

Test system and daughter unit

A preselector is omitted in a spectrum analyzer, for example, which is used to prevent an image signal from being inputted. In addition, an image signal of a signal which is located outside a range of set-up measured frequencies is suppressed as much as possible. For a range of set-up measured frequencies F&#x2dc;F, and for each of a plurality of intermediate frequencies F, the frequency of the sweep signal is swept over a range F+F&#x2dc;F+Fto determine first measured data, and is also swept over a range F&#x2212;F&#x2dc;F&#x2212;Fto determine second measured data. The first and the second measured data are compared against each other for each measured frequency point, and if they are equal, the data value obtained or a data value having a minimum value unless they are not of an equal value is delivered to obtain measured data in which image data based on image signals has been suppressed.

Frequency conversion sweep measuring method

A spectrum analyzer that incorporates a YTO (YIG tuned oscillator) as a sweep frequency local oscillator and a YTF (YIG tuned filter) as a frequency pre-selector for an incoming signal and improves a C/N (carrier to noise) ratio with low cost. The spectrum analyzer includes a YTO first local oscillator which is swept in response to a ramp signal, a base band block having a first frequency mixer for producing a first intermediate frequency (IF) signal and a second frequency mixer for producing a second IF signal, a high band block having a YTF frequency preselector for selecting frequency components in the input signal in response to the ramp signal and a high band frequency mixer for producing the second IF signal by mixing the input signal through the YTF with the first local signal, and a local signal mode switch for either directly providing the first local signal to the high band frequency mixer or through a frequency divider which divides the frequency of the first local signal by a predetermined division ratio. The YTO has a sweep frequency range which is 1/2 of a sweep frequency range of the YTF, and the division ratio of the frequency divider is two (2).

Growing community of inventors

Tokyo, Japan

Kouji Miyauchi