Hitachi, Ltd.

The University of Tokyo

Kabushiki Kaisha Topcon

Canon Kabushiki Kaisha

Nec Corporation

Hitachi Solutions, Ltd.

Kouji Kimura

Kazuhiko Mogi

Masaru Kitsuregawa

Kazuo Goda

Hirotami Koike

Yuto Hayamizu

Hajime Suzuki

Yuya Isoda

Shinsuke Hamada

Akira Shimizu

Hideki Hayashi

Yoshifumi Takehara

Daisuke Ito

Masaaki Tanizaki

Kiyoharu Tanaka

Akihiko Yamamoto

Akira Itou

Yutaka Satoh

Yasuhiro Tahara

Hiroshi Mitsuyuki

Kohei Isomatsu

Hisanori Kajiyama

When a DBMS receives a suspend instruction in which a suspend completion time of query processing is a future time and between receipt of the suspend instruction and the suspend completion time, if there is a target object (at least a processing object whose execution is in progress upon receipt of the suspend instruction) whose predicted completion time is at or precedes the suspend completion time, the DBMS changes the state of the target object to a state signifying a snapshot suspend. If there is a processing object whose state signifies a snapshot suspend, the DBMS executes the processing object at or before the suspend completion time.

Database management system and database management method

There is provided a database management system (DBMS) in order to make anonymization processing of the database efficient. When receiving a query including a conversion rule, the database management system is configured to process a relationship table in the database based on the conversion rule. At that time, the DBMS is configured to acquire data from a processing result table (result of processing the relationship table) stored in the past for tuples the number of which for each value appearing in a predetermined attribute satisfies a condition required for the anonymization processing. On the other hand, for tuples the number of which for each value appearing in a predetermined attribute does not satisfy the condition required for the anonymization processing, the DBMS is configured to acquire data from the database or from a result of processing the relationship table, the result being stored in rather than the processing result table.

Database management system and anonymization processing method

If a query indicates joining of N (N is an integer of no less than 3) relation tables, a database management system calculates a query cost that is based on a power consumption amount for query execution, for each of a first query plan candidate in which a temporary table is generated and the temporary table is stored in a storage device unit with a first access cost, a second query plan candidate in which a temporary table is generated and the temporary table is stored in a storage device unit with a second access cost that is higher than the first access cost and a third query plan candidate in which the N relation tables are joined in a pipelined manner without generation of a temporary table, selects a relatively low-query cost query plan candidate and executes the query based on the query plan candidate.

Database management system and method

A database system comprises an interface for a storage device, and a control device for accessing the storage device through the interface. The storage device stores a table that manages a plurality of rows comprising a plurality of item values, and an index configured in a tree structure based on a plurality of nodes enabling to identify the rows by using one or more item values. The control device identifies an item value condition included in a search condition of a search query, determines whether or not the node of the index corresponding to the item value condition is reference-disabled, and when the node is reference-disabled, identifies a range of item values managed by the reference-disabled node, and searches for a row that satisfies the search condition for the identified range.

Database system and database management method

A DBMS is configured to identify a Boolean expression and conditional expressions from a search query, and to extract for each of the identified conditional expressions the value of a record ID conforming to a conditional expression. The DBMS is configured to change a conformity result value corresponding to the extracted record ID and conditional expression to a first value signifying conformity, in Boolean expression determination information, which is information that includes a determination set having a record ID value and a plurality of conformity result values respectively corresponding to a plurality of conditional expressions, and, on the basis of the Boolean expression, to perform logical operations on the plurality of conformity result values of a determination set, for each determination set in the Boolean expression determination information.

System, apparatus, and method for executing a query including boolean and conditional expressions

Provided is a k-nearest neighbor search method of searching for a query number k of nearest points to an arbitrary point in a DBMS for creating a spatial index from multidimensional points, comprising setting a search conditions, judging which of a lowest branch and an intermediate branch of the spatial index a nearest region to the query point is, calculating, when the nearest region is judged to be the lowest branch, a distance between the query point and a child region of the nearest region, storing information of a divided region which has become a calculation target, calculating, when the nearest region is judged to be the intermediate region, a distance between the query point and a point included in the nearest region, storing information of the point which has become a calculation target, finishing search processing when the search conditions are satisfied, and obtaining a search result from the DBMS.

K-nearest neighbor search method, k-nearest neighbor search program, and k-nearest neighbor search device

A scanning electron microscope in the present invention includes an electron sourceto radiate an electron beam, an objective lens systemto focus the radiated electron beam on a sample, scanning systemsto scan the focused electron beam on the sample, secondary electron detection systemsto detect secondary electrons emitted from the sample, and a secondary electron image displaying systemto display a secondary electron image of the samplewith a secondary electron detection signal from the secondary electron detection system. The objective lensis composed of first and second objective lenses. The first objective lensis mainly excited when using in a wide visual field mode and the second objective lensis mainly excited when using in a high resolution mode.

Scanning electron microscope

A scanning electron microscope system with an electrostatic magnetic field complex objective lens, comprising at least two or more deflection means for tilting a primary electron beam and for projecting the primary electron beam onto a specimen, wherein one of the deflection means is arranged near the objective lens so as to generate a deflection field and also to serve as a compensation field for compensating abaxial aberration at the same time, and abaxial aberration of the primary electron beam deflected by the deflection means is compensated.

Scanning electron microscope system

A scanning electron microscope comprises: an electron beam source, an electron beam acceleration device for accelerating primary electrons generated by the electron beam source, a deflector for scanning and deflecting the accelerated primary electrons, a magnetic-electrostatic compound objective lens for focusing the scanned and deflected primary electrons onto a specimen mounted on a specimen support, a reflection electron detector for detecting reflection electrons generated from the specimen due to focusing and irradiating the primary electrons onto the specimen a secondary electron detector for detecting secondary electrons generated from the specimen due to focusing and irradiating the primary electrons onto the specimen and an image display device for displaying a specimen image from detection signals from each detector Moreover, there is provided an aperture around an axis for passing an electron beam and secondary electrons around the axis through the reflection electron detector This gives a: scanning electron microscope device which can separate and detect on an electron beam axis, reflection electrons and secondary electrons from a specimen, with a device of a simple construction.

A level converter circuit includes a differential amplifier 20 having a load resistor 8 supplied at its one end with a voltage which is stabilized against the variation of a power voltage by an emitter-follower transistor 4 receiving at its base a bias voltage from a bias circuit 9, 12-14. An intermediate signal is derived from the other end of the load resistor and supplied to a level shift circuit 25.

Level converter circuit converting input level into ECL-level against

An image forming apparatus includes recording material carrying device for carrying thereon a recording material; image forming device for forming an image on the recording material carried on the recording material carrying device; attracting charger for electrostatically attracting the recording material on the recording material carrying device, the attracting charger first attracting the recording material on the recording material carrying device; feeding rollers for feeding the recording material to the recording material carrying device to attract it to the recording material carrying device, wherein a feeding speed by the feeding rollers is the same as or larger than a movement speed of the recording material carrying device or larger.

Image forming apparatus having recording material carrying means

An image forming apparatus including a transfer material supporting device. An elastic member, a movable supporting member, a deformation preventing member or a friction member is provided between a transfer material supporting sheet and a frame constituting the transfer material supporting means or adjacent to the mounting position of the transfer material supporting sheet on the frame. By doing so, the transfer material supporting sheet is prevented from twisting or the like, so that images having good quality can be provided stably.

Image forming apparatus

A word processor is disclosed in which a central processing unit for editing a document on the basis of characters, rule line data and processing commands from a keyboard, has an automatic tabset function of setting a tab automatically in the column following a column where a ruled line is set, on the basis of the ruled line data.

Growing community of inventors

Tokyo, Japan

Kouji Kimura