Rigaku Industrial Corporation

Japan Tobacco Inc.

Kouichi Aoyagi

Naoki Kawahara

Yasujiro Yamada

Hiroshi Ueno

Takashi Shoji

Susumu Katoh

Tomoyuki Manabe

Minoru Inoue

Akira Arake

Takashi Shimada

Kazuhiro Tsutsumi

Shin-Ya Sasaki

Takashi Misonoo

Takashi Sakamoto

The spiro compound represented by the following general formula [Ia], its pharmaceutically acceptable salt or a solvate thereof 

Spiro compounds and pharmaceutical use thereof

To provide an X-ray fluorescence spectrometer capable of providing a stable fluorescent X-ray intensity regardless of the presence of irregularities or the like on a surface of a sample to be analyzed, the X-ray fluorescence spectrometer includes an X-ray source including a primary X-ray limiting diaphragm An aperture of the primary X-ray limiting diaphragm is of a shape effective to allow change in intensity of fluorescent X-rays measured by a detector to be not higher than 1% in the event that a height of the sample surface relative to the X-ray source and the detector changes 1 mm at maximum.

X-ray fluorescence spectrometer

A fluorescent X-ray analyzer includes a detector ( ) for detecting fluorescent X-rays ( ) emitted from a sample piece ( ) to be analyzed, and a first collimator ( ) disposed between the sample piece ( ) and the detector ( ) supported for movement between inserted and retracted positions with respect to a path of travel of the fluorescent X-rays ( ) towards the detector ( ). The first collimator ( ) comprises a wall ( ) adjacent the sample piece ( ) that is stepped to provide stepped wall segments ( ) having respective apertures ( ) of varying diameters defined therein. The smaller the aperture, the closer it is to the sample piece ( ) when one of the apertures ( ) is selected according to a size of a target area of the sample piece ( ) to be measured and is then brought in register with the path of travel of the fluorescent X-rays ( ) towards the detector ( ).

Fluorescent X-ray analyzer

A fluorescent X-ray analyzing apparatus capable of being used as either a wavelength dispersive type or an energy dispersive type is provided, with which the analysis can be performed quickly and accurately. The fluorescent X-ray analyzing apparatus includes a detecting unit for detecting and analyzing fluorescent X-ray (,) emitted from at least one target area (,) of a sample (,) to be analyzed as a result of excitation of such target area (,) with a primary X-ray (,). The detecting unit includes a wavelength dispersive type detecting unit (,) including a spectroscope (,) and a first detector (,), and an energy dispersive type detecting unit (,) including a second detector (,) of an energy dispersive type. The angle &thgr;1 formed between a first path (,) of travel of the fluorescent X-ray from the target area (,) towards the spectroscope (,) and a surface of the sample (,) is equal to the angle &thgr;2 formed between a second path (,) of travel of the fluorescent X-ray from the target area (,) towards the second detector (,) of the energy dispersive type and a surface of the sample (,), but the second path (,) is shorter than the first path (,).

Fluorescent X-ray analyzer useable as wavelength dispersive type and energy dispersive type

Growing community of inventors

Takatsuki, Japan

Kouichi Aoyagi