Omron Corporation

Kosuke Tsuruta

Akira Nakajima

Toru Fujii

Reiko Hattori

Yuya Ota

Shinsuke Kawanoue

Yuki Hirohashi

Takuya Nakai

Kota Miyamoto

Yumi Tsutsumi

Noriyuki Oikawa

Hiroki Koyama

Shin Egami

Hideki Higashikage

A graph display device according to one aspect of the present invention generates a first directed graph, which contains a plurality of first nodes respectively representing device variables, edges representing the existence of a dependency relation, and a block representing a function, and a second directed graph, which contains a plurality of first nodes, edges, a block, and a plurality of second nodes arranged in the block and respectively representing function parameters. In response to an instruction from a user the display device switches between displaying the generated first directed graph and displaying the generated second directed graph.

Graph display device, graph display method, and recording medium

A technology for associating and ascertaining the location of device variables which are in a control program and correspond to devices, and the dependency relations between the device variables, when division programming is carried out, is provided. A graph display device according to one aspect of the present invention generates a first directed graph, which comprises a plurality of first nodes respectively representing the device variables, and edges representing the existence of a dependency relation, and a second directed graph, which comprises a plurality of regions corresponding respectively to each subprogram, a plurality of first nodes, and edges, wherein the first nodes are arranged in a region of a subprogram that uses the device variable to be expressed from among the plurality of regions. In response to an instruction from a user the display device switches between displaying the generated first directed graph and displaying the generated second directed graph.

An analysis device according to one aspect of the present invention supplies a definition for a dependency relation between an input parameter and an output parameter of a standard function, which cannot be derived in a dependency analysis of a control program, the definition being supplied by use of function structure information which is external information. In other words, an analysis device according to this configuration identifies a dependency relation between an input parameter and an output parameter of the standard function on the basis of function structure information that defines a dependency relation between the input parameter and the output parameter of the standard function. Therefore, the dependency relation between the input and the output of a standard function becomes clear, so the dependency relations between a plurality of device variables that mediate the standard function can be identified.

Analysis device, analysis method, and recording medium

A technology for associating and ascertaining dependency relations between device variables corresponding to respective devices with dependency relations of device variables for respective parameters of a function in a control program is provided. A graph display device according to one aspect of the present invention generates a first directed graph including a plurality of first nodes that respectively express device variables and edges that express having dependency relations, and a second directed graph including the plurality of first nodes, the edges, and a block that expresses the function, and switches and displays the generated first directed graph and second directed graph on a display device.

Graph display device, graph display method, and recording medium for associating and ascertaining dependency relations among device variables

A prediction model creation apparatus includes a feature amount acquisition unit that acquires values of types of feature amounts that are calculated from operating state data indicating an operating state of a production facility that produces a product, for both a normal time at which the production facility produces the product normally and a defective time at which a defect occurs in the product that is produced, a feature amount selection unit that selects a feature amount effective in predicting the defect from among the acquired types of feature amounts, based on a predetermined algorithm that specifies a degree of association between the defect and the types of feature amounts, from the values of the types of feature amounts acquired at the normal time and the defective time, and a prediction model construction unit that constructs a prediction model for predicting occurrence of the defect, using the selected feature amount.

Prediction model creation apparatus, production facility monitoring system, and production facility monitoring method

An estimated value or a predicted value of an output of photovoltaic generation is easily and properly determined. A learning processor constructs an output calculating model based on a measured value of an output of photovoltaic generation, sunshine hours, and a solar altitude in a learning period. The output calculating model calculates the output of the photovoltaic generation based on the sunshine hours and the solar altitude. An output calculator calculates an estimated value of the output of the photovoltaic generation in an estimation period and a predicted value of the output of the photovoltaic generation in a prediction period based on a measured value of the sunshine hours in the estimation period and the solar altitude or a predicted value of the sunshine hours in the prediction period and the solar altitude. Additionally, the features may be applied to a photovoltaic power system.

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Sakai, Japan

Kosuke Tsuruta