Konica Corporation

Kosuke Toura

Seiji Hidaka

Takashi Ishihara

Nobuaki Sugiyama

Takehiko Hamaguchi

A method of producing an analytical curve for an analyzing apparatus which provides an analysis result on the basis of the analytical curve in response to a measurement value obtained by photoelectrically measuring light intensity reflected from a slide to be analyzed. A plurality of reference slides are measured by first analyzing apparatus which has a predetermined analytical curve, thereby obtaining a plurality of first measurement values and providing a plurality of first analysis results. The plurality of reference slides are further measured by second analyzing apparatus, thereby obtaining a plurality of second measurement values. Analytical curve for the second analyzing apparatus for produced on the basis of a relation between the first measurement values and the second measurement values so that a plurality of second analysis results correspond to the plurality of first analysis results.

Growing community of inventors

Hachioji, Japan

Kosuke Toura