Samsung Electronics Co., Ltd.

Koo-hyun Chung

Jin-Gyoo Yoo

Dae-Eun Kim

A probe for a data storage apparatus. The probe includes a coating layer formed on a tip of the probe, wherein a peak of the tip is exposed and the coating layer and the peak form a predetermined contact area with respect to a recording medium. In addition, the probe may also include an insulating layer formed between the coating layer and the tip of the probe. The coating layer, the insulating layer, and the peak of the tip have a predetermined contact area with respect to the recording medium. Consequently, the probe can obtain high resolving ability by using a sharp-type tip and simultaneously can reduce the degree of abrasion of the peak of the tip, thereby resulting in an excellent durability.

Growing community of inventors

Guri-si, South Korea

Koo-hyun Chung