Applied Materials, Inc.

Kommisetti Subrahmanyam

Michael Johnson

Tony Davis

Scott Singlevich

Joseph Yudovsky

Todd J Egan

Jimmy Iskandar

Bradley D Schulze

Haw-Jyue Luo

Methods and systems for accurate arc detection in semiconductor manufacturing tools are disclosed. Such methods and systems provide real-time arc detection and near real-time notification for corrective actions during a semiconductor manufacturing process. Such methods and systems utilize data with high sample rate and wavelet analysis to provide for more accurate arc detection, which leads to more effective and cost efficient semiconductor manufacturing operations.

System to detect wafer arcing in semiconductor manufacturing equipment

A method is provided for determining one or more causes for variability in data. The method includes selecting a first range of a multivariate model output data on a user interface and employing a computing system, operatively coupled to the user interface, to determine one or more process data causing a variability of the multivariate model output data in the first range when compared to a second range of the multivariate model output data. At least some of the process data includes data derived from a physical measurement of a process variable.

Apparatus and method for integrating manual and automated techniques for automated correlation in data mining

Method to detect wafer arcing in semiconductor manufacturing equipment

A semiconductor substrate processing system having acoustic monitoring is disclosed. The system includes a process chamber adapted to perform a process on a substrate, a process fluid source, a fluid conduit coupling the fluid source to the process chamber, and a flow control valve located along the fluid conduit and adapted to be operable to control a flow of a process fluid between the process fluid source and the process chamber. The system includes one or more acoustic sensors operable to sense acoustic noise coupled to at least one of the process fluid source, the fluid conduit, and the flow control valve, and an acoustic processor adapted to receive at least one signal from the one or more acoustic sensors. Acoustic monitoring methods are provided, as are other aspects.

Acoustically-monitored semiconductor substrate processing systems and methods

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Singapore, Singapore

Kommisetti Subrahmanyam