Shimadzu Corporation

Koki Yamamoto

Takeshi Yoshida

Masumi Sakai

Tsutomu Watanabe

Noriyuki Ojima

Teppei Kodama

An analysis system includes an analysis apparatus that analyzes a specimen managed in an analysis center and a server apparatus managed in a service center. A server apparatus stores a first reference specimen ID for identifying a first reference specimen and a first range based on a first reference value, in association with each other. The analysis apparatus analyzes the first reference specimen provided without notification of the first reference value and transmits to the server apparatus, the first reference specimen ID and an analytical value of the first reference specimen with which the first reference specimen ID is associated. When the server apparatus determines the received analytical value of the first reference specimen as not belonging to the first range stored in association with the received first reference specimen ID, the server apparatus provides an abnormality signal.

Analysis system, server apparatus, control method, and computer readable recording medium

A system for managing modular analyzing devices-includes: a meansfor acquiring the serial number of modules included in each analyzing device; a meansfor acquiring information on an expendable part included in each module; a storage sectionfor storing the acquired serial number and expendable-part information in the state of being associated with a system controller to which the module corresponding to the serial number is connected; a transfer detectorfor detecting a transfer of an operation module based on the serial numbers associated with each system controller; and an information managerfor changing the association of the expendable-part information in the storage section, from the state of being associated with the system controller on the giving end of the transfer, to the state of being associated with the system controller on the receiving end of the transfer, when the transfer is detected.

Analyzing device management system

At the time of measurement of a sample, before a sample is introduced into a graphite tube, signal voltages which would be detected by a photomultiplier in connection with all programmable combinations of atomizing temperatures of a graphite tube, widths of entrance and exit slits provided in a spectrometer, and wavelengths into which the light is to be decomposed by the diffraction grating are stored in memory beforehand. At the time of measurement of a sample, an amplification factor of the photomultiplier is controlled by a negative high-voltage controller according to measurement requirements, or measurement is performed after an optimum detector signal voltage is set by controlling the amplification factor of the detector signal output from an amplifier.

Growing community of inventors

Kyoto, Japan

Koki Yamamoto