Altera Corporation

Kok Sun Chia

Kar Keng Chua

Jayabrata Ghosh Dastidar

Jun Pin Tan

Yee Liang Tan

Siew Ling Yeoh

Chiew Khiang Kuit

Integrated circuits (ICs) with configurable test pins and a method of testing an IC are disclosed. An IC has input/output (I/O) pins that can be configured either as a test input pin, a test output pin or a user I/O pin. Selector circuits are used to selectively route and couple the I/O pins to various logic blocks and test circuitry on the IC. Selector circuits are also used to selectively couple either a user output or a test output to different I/O pins on the IC. Switches are used to configure the selector circuits and route test signals within the IC. Different configurations of the switches determine how the signals are routed. Test input signals from an I/O pin may be routed to any test circuitry within the IC and test output signals from a test circuit may be routed to any I/O pin on the IC.

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Kuala Lumpur, Malaysia

Kok Sun Chia