Hgst Netherlands, B.v.

Kojiro Komagaki

Masashige Sato

Hiroyuki Hoshiya

Katsumi Hoshino

Norihiro Okawa

Embodiments disclosed herein generally relate to a TMR sensor for reading a recording from a magnetic recording medium using TMR, and in particular, to a magnetic capping structure of the TMR sensor. The sensor comprises a free layer and a magnetic capping structure. The magnetic capping structure comprises a ferromagnetic capping layer and an absorption layer formed on the ferromagnetic capping layer. The absorption layer is adapted to absorb molecules from the ferromagnetic capping layer and prevent the ferromagnetic capping layer from diffusing into the free layer.

Confinement magnetic cap

In one embodiment, a tunnel magnetoresistance (TMR) head includes a lead layer above a substrate, a seed layer above the lead layer, an antiferromagnetic (AFM) layer above the seed layer, a first ferromagnetic layer above the AFM layer, a second ferromagnetic layer above the first ferromagnetic layer, a coupling layer between the first and second ferromagnetic layers, the coupling layer causing a magnetization of the second ferromagnetic layer to be coupled to a magnetization of the first ferromagnetic layer, a fixed layer above the second ferromagnetic layer, an insertion layer adjacent the fixed layer or in the fixed layer, a barrier layer above the fixed layer, a free layer above the barrier layer, and a cap layer above the free layer. In another embodiment, the insertion layer is from about 0.05 nm to 0.3 nm in thickness and includes Ta, Ti, Hf, and/or Zr, and the free layer includes CoFeB.

TMR sensor film using a tantalum insertion layer and systems thereof

According to one embodiment, a magnetoresistive effect head includes a magnetically pinned layer having a direction of magnetization that is pinned, a free magnetic layer positioned above the magnetically pinned layer, the free magnetic layer having a direction of magnetization that is free to vary, and a barrier layer comprising an insulator positioned between the magnetically pinned layer and the free magnetic layer, wherein at least one of the magnetically pinned layer and the free magnetic layer has a layered structure, the layered structure including a crystal layer comprising one of: a CoFe magnetic layer or a CoFeB magnetic layer and an amorphous magnetic layer comprising CoFeB and an element selected from: Ta, Hf, Zr, and Nb, wherein the crystal layer is positioned closer to a tunnel barrier layer than the amorphous magnetic layer. In another embodiment, a magnetic data storage system includes the magnetoresistive effect head described above.

Growing community of inventors

Kanagawa, Japan

Kojiro Komagaki