Fujitsu Semiconductor Limited

Fujitsu Corporation

Cypress Semiconductor Corporation

Spansion LLC.

Koji Okada

Suguru Tachibana

Kenta Aruga

Kazuhiro Tomita

Shinichi Yamamoto

Takashi Shimizu

Masuo Inui

Akihiro Suzuki

Susumu Kuroda

Masami Nakashima

Takeo Zaitsu

Hiroyuki Matsunami

Sanroku Tsukamoto

Masahiro Tanaka

Toru Miyamae

Yoshiyuki Endo

Syuichi Saito

Kazuhiro Mitsuda

Takaaki Ido

Yasukazu Ono

Masao Iijima

Kazuyoshi Futamura

Tomonobu Miyata

A device includes a master delay-lock loop (DLL) having a phase frequency detector connected in series with a charge pump that is to generate a control voltage. A slave DLL is coupled to the master DLL and has a delay line including a buffer to receive a slave clock and a series of delay cells coupled between the buffer and an output terminal that is to output a delay clock, the series of delay cells variably controlled by the control voltage. The master DLL and the slave DLL are powered by a power supply that experiences undershoot or overshoot in response to a load transient. A dummy load is coupled between the delay line of the slave DLL and an output of the power supply, the dummy load including an exclusive OR gate that receives, as inputs, a first output of the buffer and the delay clock.

Reducing delay-lock loop delay fluctuation

A bus interface bus is described. A first logical state is conveyed over the bus by a higher voltage level and a second logical state is conveyed by a lower voltage level. An output stage of the interface includes a power transistor configured to drive the lower voltage level onto the bus to convey the second logical state, and a protective device between the power transistor and the bus. The protective device couples the power transistor to the bus when turned on and limits negative voltage excursions at the power transistor when turned off. A control circuit of the interface is configured to turn on the protective device when the bus voltage is above the lower voltage level and to turn off the protective device when the bus voltage is at or below the lower voltage level.

Negative voltage protection for bus interface devices

An on-vehicle system comprises a Clock Extension Peripheral Interface (CXPI) bus and a device coupled to the CXPI bus as a slave node. The device comprises a transceiver configured to: generate a first signal by delaying an inverted signal of a transmission data signal; generate a second signal based on the transmission data signal, where the second signal has a low slew rate; selectively output the first signal or the second signal as a third signal, in response to a selector signal; and generate a clock signal in response to the third signal, where the clock signal is at a high level when the third signal is at a low level, and where the clock signal is at the low level when the third signal is at the high level.

Asynchronous transceiver for on-vehicle electronic device

An on-vehicle system comprises a Clock Extension Peripheral Interface (CXPI) bus and a device coupled to the CXPI bus. The device comprises a transceiver configured to: detect a baud rate clock signal and a phase difference between the baud rate clock signal and an input data signal that was generated asynchronously from the baud rate clock signal; obtain a timing from an edge of the baud rate clock signal based the phase difference; capture a value of the input data signal at the timing; and transmit the captured value as an output data signal over the CXPI bus.

An on-vehicle electronic device has a generating unit configured to generate a first clock for data communication with another on-vehicle electronic device through a CXPI communication network; and an adjusting unit configured to adjust a duty width of the first clock.

An analog circuit cell array includes a plurality of transistor cell arranged in an array. Each of the transistor cells includes a first source region, a first channel region, a common drain region, a second channel region, and a second source region arranged in sequence one adjacent to another; and a first gate electrode and a second gate electrode formed on the first channel region and the second channel region, respectively, and wherein the first gate electrode and the second gate electrode are connected together for use, and the first source region and the second source region are connected together for use.

Analog circuit cell array having some transistors that include two connected gate electrodes and two connected source regions

A reference voltage circuit includes a first amplifier configured to output a reference voltage, a second amplifier coupled to the first amplifier, an offset adjustment voltage generation circuit, a first load device and a first pn junction device, and second and third load devices and a second pn junction device. The offset adjustment voltage generation circuit is configured to generate a voltage which is input to the third and fourth input terminals of the second amplifier, and reduce an offset voltage between the first and second input terminals of the first amplifier through the second amplifier. The first input terminal is coupled to a coupling node of the first load device and the first pn junction device, and the second input terminal is coupled to a coupling node of the second load device and the third load device.

Reference voltage circuit and semiconductor integrated circuit

A phase locked loop (PLL) circuit including a phase comparator for comparing a phase of a reference signal with a phase of a feedback signal, an oscillator for outputting an output signal at a frequency in accordance with an output of the phase comparator, a feedback loop for returning the output signal of the oscillator and supplying the output signal as the feedback signal, and a delay circuit for delaying the phase of the output signal output from the oscillator to a load circuit, wherein the delay circuit is provided outside the feedback loop.

PLL circuit

A successive approximation A/D converter, has a main DAC having a capacitive element group coupled to a top node and a switch group; a comparator comparing voltage of the top node with comparison reference voltage; a correction DAC generating correction voltage in accordance with a capacitance error of a capacitive element pair to be balanced in the main DAC, and supplying the correction voltage to the top node; and a control circuit generating internal digital input for controlling the switch group and a correction code for controlling the correction voltage, and outputting a successive approximation result by the comparator when the A/D conversion is performed. The control circuit measures a capacitance error of the capacitive element pair to be balanced, and determines an offset-removed capacitance error where an offset generated in the measurement is removed from the capacitance error.

Successive approximation A/D converter

An oscillation circuit including a reference voltage generation circuit that adds a proportional-to-absolute-temperature (PTAT) output, which increases in proportion to an absolute temperature, to a complementary-to-absolute-temperature (CTAT) output, which decreases in proportion to an absolute temperature, to generate and output a reference voltage. The oscillation circuit generates an oscillation signal having a desired and fixed frequency.

Oscillation circuit

A spread spectrum clock generation circuit and a controlling method thereof are disclosed, which provide clocks having less jitter and ideal spread spectrum and enable a reduction in circuit scale and in power consumption. To this end, a current control type modulatoris equipped with a current source Ia (current). A charger unit CGa and a discharger unit DGa are designed such that currents i,andare allowed to flow, for example, by properly setting the sizes of transistors. Modulation cycles CIa to CIIIa are repeated and an output code is generated from a switching control circuitaccording to each modulation cycle. A switching unit SSa is controlled according to the output code, thereby charging or discharging a capacitor element Cwith a charge/discharge current CDI corresponding to the output code. Hence, charge amounts and discharge amounts for all the modulation cycles CIa to CIIIa have the same value, i.e.,[A&#xb7;clock].

Spread spectrum clock generation circuit and a method of controlling thereof

An oscillating apparatus includes: a transfer gate including a P-channel transistor and a N-channel transistor; a first inverter for inverting an output signal of the transfer gate and outputting the inverted output signal of the transfer gate; a second inverter for inverting the output signal of the first inverter and outputting the inverted output signal of the first inverter; a third inverter for inverting the output signal of the first inverter and outputting the inverted output signal of the first inverter; a fourth inverter for inverting the output signal of the third inverter and outputting the inverted output signal of the third inverter to an input-terminal of the transfer gate; a first capacitor connected between an output-terminal of the transfer gate and an output-terminal of the second inverter; and a second capacitor connected between the output-terminal of the transfer gate and a reference potential node.

Oscillating apparatus

An A/D converter includes a capacitive DAC configured to perform conversion of high-order bits by receiving a differential signal, a resistive DAC configured to perform conversion of low-order bits, a resistive correction DAC configured to operate to correct the capacitive DAC, and a comparator. The capacitive DAC includes a positive-side capacitive DAC and a negative-side capacitive DAC operating in a complementary fashion, and the comparator, which includes a plurality of differential circuits, is configured to compare output potentials of the positive-side capacitive DAC and the negative-side capacitive DAC. The positive-side capacitive DAC and the negative-side capacitive DAC include first capacitive elements each formed from interconnect layers excluding an uppermost interconnect layer, and the comparator includes second capacitive elements each provided between adjacent ones of the differential circuits and formed from interconnect layers including the uppermost interconnect layer.

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Kasugai, Japan

Koji Okada