Fujifilm Corporation

Koji Miyata

Hiroyuki Noda

Daisuke Sawai

Tadashi Kajiya

Provided are a physical property measurement method, a physical property measurement device, and a probe that can simply measure physical properties of a surface layer portion of an object. A physical property measurement method includes a step of bringing a probe into contact with a surface layer portion of a liquid or gel-like object and maintaining a contact state, a step of measuring a height of the object rising along the probe in contact with the object, and a step of calculating viscous properties or elastic properties of the surface layer portion of the object using the measured height of the object rising along the probe.

Growing community of inventors

Kanagawa, Japan

Koji Miyata