Denso Corporation

Koji Ino

Ryonosuke Tera

Kahoru Mori

Taizo Ishida

Yusuke Watanabe

Shoichi Kawai

Shigeru Miyaji

A color organic EL display includes: a substrate; a color filter layer disposed on the substrate; a gas barrier layer disposed on the color filter layer; and an organic EL structural body disposed on the gas barrier layer. The substrate and the color filter layer provide an underlayer of the gas barrier layer. The underlayer is a degassed underlayer. The gas barrier layer is provided by an atomic layer deposition method at a temperature equal to or lower than a decomposition starting temperature of the color filter layer.

Method for manufacturing color organic EL display

An organic EL display includes an organic material, a gas barrier layer on the member, and an organic EL unit on the gas barrier layer. The gas barrier layer comprises AlxTiyOz, wherein Al represents aluminum, Ti represents titanium, O represents oxygen, x represents the ratio of atoms of Al, y represents the ratio of atoms of Ti, and z represents the ratio of atoms of O. A Ti-atom ratio of the gas barrier layer is given in the units of atom % and defined by the following equation: Ti-atom ratio={y/(x+y)}&#xb7;100. The gas barrier layer has a first portion at an interface with the member and a second portion at an interface with the organic EL unit. The Ti-atom ratio of the first portion is 0 atom %. The Ti-atom ratio of the second portion is greater than or equal to 10 atom %.

Organic electroluminescent display and method of making the same

A probe made of copper and supported by a movable arm via a load cell and a jig has a joining surface having good wettability with solder at the tip end thereof and has a covering portion having poor wettability with the solder around the circumferential periphery. The solder and flux are stuck to the joining surface and the solder is put into contact with a bump electrode to be tested on a substrate in this state. Then, the solder is melted by an induction heating coil and then cooled down and solidified to join the bump electrode to be tested to the probe. The bump electrode is broken by pulling up the probe in this state at a constant speed and at the same time the pulling force exerted on the probe is measured by the load cell.

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Kariya, Japan

Koji Ino