Konica-Minolta Holdings, Inc.

Konica Corporation

Horii Toshado Kabushiki Kaisha

Koji Horii

Kazumi Furuta

Koujirou Sekine

Mitsuru Yokoyama

Hiroaki Ueda

Masahiro Morikawa

Yukihiro Ozeki

Manami Kuiseko

Hiroshi Miyakoshi

Naoki Mitsugi

Yoshiki Shibuya

An optical element holding structure, having: an optical element including an optical section having optical function, an outer peripheral portion which is positioned at the outer peripheral side of the optical section and a mounting portion which protrudes from the outer peripheral portion in a direction substantially parallel to the optical axis; and a lens barrel holding the optical element inside.

Optical element holding structure, optical element lens-barrel and optical communication module

An optical bidirectional modulehaving therein light emitting elementwhich transmits optical signal to the end facet of the optical fiber, light receiving elementwhich receives optical signal from the end facet of the optical fiber and stair-shaped multi-level grating, wherein the stair-shaped multi-level grating separates the first light path between the end facet of optical fiber and the light emitting element and the second light path between the end facet of optical fiber and the light receiving element by a different wavelength of each optical signal, when the module mixes and separates optical signal with different wavelengths traveling in opposite directions related to the end facet of the optical fiberused for bidirectional optical fiber communication by means of a wavelength multiplex system.

Optical bidirectional module

A method and an apparatus for measuring capacitances between electrodes of an ink-jetting head. The apparatus includes a multi-probe having a plurality of probes to contact a plurality of electrode rows as one lump contact, each of the probes contacting one of the electrode rows and a plurality of the probes being divided into a predetermined number of groups. The apparatus further includes a plurality of scanners, each of which corresponds to each of the groups, to sequentially switch contacting-terminals of a plurality of the probes and a plurality of capacitance-measuring devices, each of which corresponds to each of the scanners, to measure capacitances between electrodes in all of the groups in parallel.

Method and apparatus for measuring capacitance

Duplicator

Growing community of inventors

Tokyo, Japan

Koji Horii