Panasonic Intellectual Property Management Co., Ltd.

Koichi Wakitani

Nobuo Hara

Akihisa Nakahashi

Seita Takahashi

Tomoyuki Ishikawa

Hiroko Yoshida

An experiment of processing a device is performed to acquire typeinformation and typeinformation indicating processing conditions, and typeinformation and typeinformation indicating results of the processing, derive a first relation between the typeinformation, the typeinformation, and the typeinformation, and a second relation between the typeinformation, the typeinformation, and the typeinformation, and generate and output a model that estimates the typeinformation indicating a result of the processing by using the first relation and the second relation with the typeinformation and the typeinformation that are measured during the processing as inputs.

Generation method, estimation method, generator, and estimator

An information processing method calculates a position of a feature corresponding to a trace in a first coordinate system, calculates a position of the feature corresponding to the trace in a second coordinate system, and calculates a size of a first distribution of the position of the feature corresponding to the trace in the first coordinate system and a size of a second distribution of the position of the feature corresponding to the trace in the second coordinate system. Additionally, the information processing method outputs information indicating that the feature corresponding to the trace is the trace formed on the surface of the workpiece in the machining process, and outputs information indicating that the feature corresponding to the trace is a false detection of the trace in the inspection process.

Growing community of inventors

Toyama, Japan

Koichi Wakitani