Otsuka Electronics Co., Ltd.

Koichi Oka

Akira Kawaguchi

Yasuhiro Kubo

Satoshi Nitta

Kunio Kumagai

Takashi Nakamura

Kazunori Tsutsui

Katsuhiro Morisawa

Yoshi Enami

Makoto Okawauchi

Yasushi Zasu

Toshiyuki Imoto

Motonobu Akagi

William Otani

Harumi Toda

Susumu Takamura

Minoru Yoshida

Ichiro Kanki

Masayoshi Funato

Naomi Negayama

Tetsuo Hamada

Michio Tsujio

A system is disclosed, which comprises a rotatable mirror, a camerafor taking an image of a screenthrough the mirror, a photodetectorhaving a detection range covering a part of the screen, and a control section. At a time when a measuring pattern included in a moving image displayed on the screenis detected by the photodetector, a detection signal is outputted from the photodetector. Based on the detection signal, the control section triggers the mirrorto rotate, and after the mirrorstarts rotating, the control sectioncontrols so that the mirrorrotates to follow the motion of the measuring pattern. It is possible to obtain images that trace the motion of the moving image on a detector plane of the camerawithout resorting to electrical synchronization of the rotation of the mirror and moving image signals, and to measure the moving image quality of displays with a simple structure.

Measurement system for evaluating moving image quality of displays

A test pattern is moved on a screensubject to measurement with the field of view of an image sensor pursuing the motion of the test pattern so as to observe BEW. Subsequently, the field of viewof the image sensor is moved at the same velocity vc as in the foregoing observation to capture an image of a static pattern PE, and a blur width W along the scrolling direction that appears in a distribution profile of the captured image is observed. Based upon the blur width W and the exposure time of the image sensor for capturing the image of the static pattern PE, the moving velocity of the test pattern at the time of observation of the BEW is estimated, and by using the moving velocity, the BEW is normalized. Evaluation of the moving image quality of the screen is carried out by using the normalized N BEW. The moving velocity of the original test pattern can thus be estimated easily and accurately, and accordingly, the moving image quality of the screen can be evaluated accurately.

Method and system for evaluating moving image quality of displays

A measurement pattern is moved on a display, and an image of the measurement pattern is captured by making a visual field of an image sensor follow the scroll of the measurement pattern. On the basis of the captured image, a motion picture response curve is obtained. Then, the motion picture response curve is transformed into an MTF (modulation transfer function). A normalized spatial frequency value N_Sf(a %) at which an MTF value starts declining by a predetermined percentage from a highest luminance portion of the MTF is determined. Then, the motion image quality of the display is evaluated on the basis of the normalized spatial frequency value N_Sf(a %). Thus, the evaluation of the motion image quality of the display can be achieved on the basis of an intuitively understandable motion image quality evaluation index.

Display evaluation method and apparatus

An inventive optical cell measurement apparatus comprises a light source (S) which emits light having a predetermined wavelength range, a first mirror (M) which reflects the light emitted from the light source (S), a long light path gas cell () to which the light reflected on the first mirror (M) is introduced, a second mirror (M) which reflects light outputted from the long light path gas cell (), a sensor (D) which detects the light reflected on the second mirror (M), and optical elements () disposed in a light path extending from the light source (S) to the sensor (D) and each having a bifocal property with different focal lengths as measured in two directions (X, Y) perpendicular to the light path. With this arrangement, the aberration of spherical mirrors () disposed in the gas cell () is corrected, thereby preventing reduction of the transmittance of the gas cell ().

Optical cell measurement apparatus

Impurity is removed from gas, the resultant gas is introduced into a cell, and the intensity of light transmitted through the cellis measured as a reference. Gas containing impurity of which concentration is known, is introduced into the cell, and the intensity of light transmitted through the cellis measured with the temperature and pressure maintained at those used at the measurement of the reference light intensity. Then, the absorbance of the impurity is obtained according to the ratio of the two light intensity data obtained by the two measurements above-mentioned. The impurity absorbance thus obtained is stored, in a memory, as a function of an impurity concentration. Gas containing impurity of which concentration is unknown, is introduced into the cell, and the intensity of light transmitted through the cellis measured with the temperature and pressure maintained at those used at the measurements above-mentioned. The absorbance of the impurity is obtained according to the last-measured light intensity and the reference light intensity. The absorbance thus obtained is applied to the function, thereby to obtain the impurity concentration.

Method of and apparatus for determining the amount of impurity in gas

The present invention relates to a light scattering intensity measuring apparatus capable of measuring, as a function of the scattering angle, the intensity of the light scattered from a sample. This apparatus comprises an ellipsoidal mirror for reflecting and condensing the scattered light from a sample ; an image-forming lens disposed at the condensing point of light reflected by the ellipsoidal mirror for forming, on a camera face, the image formed on the surface of the reflection mirror ; and a camera for recording the image formed by the image-forming lens . The scattered light in a wide angle range can be detected in a very short period of time (FIG. ).

Apparatus for measuring characteristics of optical angle

NMR measuring method and measuring apparatus for tissue of a living body

A differential refractometer in which: light from a light source is condensed on a lens; the light thus condensed is guided to a cell which houses a sample of which refractive index is to be measured and a reference of which refractive index is used as a reference value, the sample and the reference being housed as separated from each other in the cell; the light having passed through the cell is guided to an image sensor; and the amount of light deflection due to the difference in refractive index between the sample and the reference is measured, thereby to obtain the refractive index of the sample. The differential refractometer comprises: a light permeable member disposed at such a position that the light permeable member and the image sensor are optically conjugate with respect to the lens, the light permeable member carrying an image having at least two identification portions; and a spatial filter disposed between the light permeable member and the image sensor and adapted to spatially filter light portions which have passed through the two identification portions, the spatial filter causing at least one of the light portions thus spatially filtered to pass through the cell. The refractive index of the sample may be obtained based on the distance between the positions of images, on the detecting surface of the image sensor, of the two identification portions of the light permeable member. Such an arrangement may improve the measuring precision and reduce the number of component elements.

Differential refractometer

Light scattering measuring apparatus utilizing a photodetector mounted

There is disclosed a system in which, according to the time domain method, a laser light is irradiated to an object to be measured, photon pulses based on the scattering light from the object to be measured are received, time series data are generated based on the light receiving signal, and based on the time series data thus generated, the particle size distribution of particles in the object to be measured is measured. Thus, the present invention achieves a considerable reduction in time required for finally obtaining the particle size based on the measured data, as compared with a conventional system using a calculator program.

Particle size measuring system

Growing community of inventors

Otsu, Japan

Koichi Oka