Matsushita Electric Industrial Co., Ltd.

Matsushita Electrical Industrial Co., Ltd.

Koichi Ohmori

Hiroshi Tsutsui

Sueki Baba

Tetsuro Ohtsuchi

Toshiyoshi Yamamoto

Yoshihiro Ino

Yasuhiko Shinkaji

Masanori Watanabe

Toshiyuki Kawara

Osamu Yamamoto

Yuji Matsuda

Hiroshi Watanabe

Yoshihiko Tanji

Hiromasa Funakoshi

Yoshiyuki Yoshizumi

Takayoshi Yuuzu

An X-ray imaging apparatus of the present invention is configured so that image data outputting means receives X-rays and outputs image data containing plural pixels, and, when a pixel value of a designated pixel in the image data is larger than a maximum pixel value of pixels surrounding the designated pixel by a predetermined value or more, abnormal data eliminating means judges the designated value as an abnormal data and corrects the abnormal data, thereby an optimum image quality adjustment is automatically conducted in accordance with an exposure object.

X-ray imaging apparatus and recording medium therefor

X-ray imaging apparatus and recording medium therefore

A radiographic apparatus is provided which is capable of converting an X-ray directly into an electric signal, high in resolution and detection efficiency, and easy to manufacture. On at least one surface of a compound semiconductor substrate for generating an electric charge by X-ray irradiation, a plurality of split electrodes are disposed, and electrodes are disposed on picture elements formed on a CCD corresponding to these split electrodes, and are electrically connected to CdTe as compound semiconductor substrate and the CCD. An electric current issued from the split electrodes is divided, and is partly discharged through grounding wires.

apparatus for picking up image by electromagnetic wave ray

An energy difference picture processing method comprises the steps of using a semiconductor radiation detector; providing two discriminating levels; dividing X-rays, which have passed through objects, into two kind energy zones; counting X-ray photons to obtain an X-ray picture; assembling, with corresponding coefficients, S(H), S(L), {S(H)}.sup.x and {S(L)}.sup.y, which are exponential functions of the S(H) and S(L), respectively, where S(H) is a logarithmically converted version of a picture of counts in a higher energy band and S(L) is a logarithmically converted version of a picture of counts in a lower energy band; and performing addition, subtraction, multiplication and/or division on these terms to provide a picture in which a particular one of the materials constituting the objects is selectively extracted or removed.

Energy difference image processing method

A K-edge filter whose main portion functions as a filter member and is made of a material containing at least two kinds of elements, and an X-ray apparatus is fabricated so as to include such a K-edge filter.

K-edge filter and X-ray apparatus employing the same

A K-edge filter whose main portion functions as a filter member is made of a material containing at least two kinds of elements, and an X-ray apparatus is fabricated so as to include such a K-edge filter.

K-edge filter and an x-ray apparatus employing such a filter

Transmission images are obtained by radiating X-rays having two different energy levels onto a subject in one direction, and then transformed into logarithmic images, respectively. From these logarithmic images, a contrast ratio due to the two kinds of X-rays having different energies is obtained. From this contrast ratio, the term relating to the thickness of the subject is eliminated, thereby providing information only relating to the quality of the material. By collating the information with the previously measured data of materials, the material of the subject is identified.

Radiographic image processing method and photographic imaging apparatus

A radiation sensor for the measurement of photo energies of incident radiation is disclosed which comprises a semiconductor substrate sensitive to photons of the incident radiation, at least one common electrode and at least one split electrode, both of which are disposed on the same surface of the substrate, or the common electrode being disposed on one surface of the substrate and the split electrode being disposed on the other surface of the substrate at a diagonal position to the common electrode. Also disclosed is a radiation detecting apparatus using the above-mentioned radiation sensor.

Radiation sensor and a radiation detecting apparatus using the same

A radiographic diagnostic apparatus including an X-ray tube for generating X-ray radiation, a line slit for shaping the X-ray radiation into a fan beam, a linear X-ray sensor array for detecting the X-ray radiation, and apparatus for driving the components is provided. The focal spot of the X-ray tube and the line slit are disposed on a straight line that connects between a specified fixed point and the center of the linear sensor array of a line extending therefrom. The X-ray tube, the line slit and the linear X-ray sensor array are driven together in a direction perpendicular to the direction of alignment of the linear X-ray sensor array so as to scan an object and thereby produce a radiographic image of the object.

Radiographic diagnostic apparatus

Disclosed are a radiation detector and a method of manufacturing the same. The radiation detector includes a radiation screening member for cutting off radiation incident upon the marginal portions of the radiation incident surface of a semiconductor radiation sensor or a semiconductor radiation sensor array for outputting pulses in correspondence with radiation photons, as well as upon the boundary portions between adjacent sensors. In order to manufacture such a radiation detector, leads are provided by the wire bonding, soldering or bump contacting on the radiation screening member, and at least part of the radiation screening member is then fitted to the semiconductor radiation sensor or the semiconductor radiation sensor array so as to make it electrically connected to the electrodes of the semiconductor radiation sensor or the semiconductor radiation sensor array.

Growing community of inventors

Toyonaka, Japan

Koichi Ohmori