Kabushiki Kaisha Kobe Seiko Sho

Shinko Electric Company, Ltd.

Mitsubishi Metal Corporation

Koichi Nomura

Kashiro Ureshino

Katsumi Ichikawa

Takumi Mizokawa

Yasumasa Sayama

Morihiko Iwasaki

Tadashi Tomita

Koji Ota

A conveyor system that performs a conveyance by using pallets for loading green tires and device for conveying these pallets, installs a storage area for storing pallets as they are on the way to convey, and uses robots for transferring the green tires from a pallet to a tire vulcanizer. Pallets being of such a type as to be able to load two or more green tires for planar placement and a conveyor devise is desired to be able to get under these pallets for lifting up. Furthermore, a visual sensor provided on a robot reads at least one of a mark concerning the specification of a green tire, a mark for its positioning on a pallet, and a mark for its positioning on a tire vulcanizer, identifies a green tire to be conveyed, and automatically performs a positioning in transferring the green tire from the relevant pallet and a positioning in transferring the green tire to a tire vulcanizer in the conveyor system. In addition, these tire vulcanizers, conveyor device, and robots are collectively controlled using computers.

Green tire conveyor system in a tire vulcanizer factory

The present invention discloses an Fluorescence X-ray spectrometry method and device for determining the type and quantity of metals elements in metal and metal alloy samples, particularly precious metal and precious metal alloy samples. The invention provides a method and an apparatus in which an object to be analyzed is positioned so that an X-ray beam that will be generated will coincide with a measurement point on the surface of the object where it is desired that the analysis be carried out. The measurement point is exposed to an X-ray beam having a diameter of 0.1 to 5 mm, causing fluorescence X-ray radiation to be generated which is sampled. Spectral analysis of the captured fluorescence X-ray radiation is then carried out wherein the intensity of selected peaks corresponding to target elements is determined, whereby the relative composition of selected elements can be calculated, thus providing selective quantitative analysis for target elements at the measurement point. The relative composition can be calculated by performing a computer analysis of the spectrum of the captured fluorescence X-ray radiation in which a fundamental parametric method is applied to the intensity values for peaks corresponding to each target element.

Metals assay apparatus and method

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Tokyo, Japan

Koichi Nomura