Via Technologies, Inc.

Ko-Yan Shih

Ming-Hsun Hsu

A circuit for testing a chip. The chip has an intellectual product circuit module, and the circuit has a multiplexer controller, several registers and a MUX finite state machine controller to configure these registers in different states according to the test patterns. In the next state, a test activating signal is provided to the intellectual product circuit module. The intellectual product circuit module is then operated and tested according to the output of the registers.

Method and circuit for testing a chip

A network apparatus capable of automatically configuring connection polarity includes a random number generator of a plural order for generating a plurality of random numbers, and a plurality of connectors each of which is connected to a corresponding network cable. Each of the connectors includes a signal detector for detecting a network signal, for example, a fast link pulse or a normal link pulse from the corresponding network cable, and a polarity configurer coupled between the signal detector and the random number generator for selectively changing a connection polarity of a connector thereof in accordance with one of the random numbers generated by the random number generator when the signal detector fails to detect a network signal from the corresponding network cable.

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Taipei, Taiwan

Ko-Yan Shih