Siemens Aktiengesellschaft

Omicron Electronics Gmbh

Klaus Studer

Reinhard Kaufmann

Wernich De Villiers

Michael Rasztovits-Wiech

Boris Unterer

Horst Schedler

Matthias Kukuk

Lukas Bitschnau

Michael Rädler

Felix Feustel

A test system () for testing an electric device (), in particular a high-voltage device, has a portable main device () with a housing (), an electric connection assembly () and a mechanical connection assembly () and has a portable additional device () with a separate housing (), an electric connection assembly () and a mechanical connection assembly (). The main device () can be mechanically connected to the additional device () in a releasable manner by coupling the mechanical connection assemblies () to form a structural unit, wherein the main device () can be electrically connected to the additional device () via the first electric connection assemblies ().

Test system and main device and additional device thereof for testing an electric device

In an optical fiber communication system, for signal monitoring a transparent optical network (all-optical networks), i.e. a system without digital intermediate regeneration, the bit error probability (BEP) is calculated by dismodulating and sampling the signal and generating an amplitude histogram. This histogram serves mainly for modeling the signal distortions. A family of amplitudes that represent the average of a noise-infested sub-signal is determined from the histogram for each status of the signal (logical '0' or '1'). The variance of the individual noise signal overlaid on every amplitude value is calculated from the parameters of the receiver as well as from the optical signal-to-noise ratio (OSNR). The bit error probability is calculated with adequate precision from these parameters.

Circuit for measurement of the signal quality in digital optical fiber transmission networks by interpreting the signal histogram

Growing community of inventors

Blons, Austria

Klaus Studer