C. Reichert Optische Werke Ag

Reichert-jung Optische Werke A.g.

C. Reichert Optische Werke

Klaus P Schindl

Georg N Nyman

Ferdinand Pauliny

Kurt Salzmann

Karl Moser

Kurt Merstallinger

Franz Meitz

Peter B Puxkandl

Microscope having an easily removable lamp structure

A photometer for use with a microscope having an object plane an image plane and an optical axis between said planes. The photometer includes an optical dividing means adapted to be disposed in the optical axis between the microscope object and image planes, and a reflective element having a reflecting surface. A pin hole occluder is adapted to be arranged on the opposite side of the optical dividing means to the reflective element. An optical imaging device provides an image of the pin hole occluder on the reflecting surface. A semi-reflective element is provided for reflecting light from the light source to the optical dividing means. A detector is arranged in an optical axis including the semi-reflective element, the pin hole occluder, the optical dividing means, the optical imaging device and reflective element. The object and image planes of the microscope and the reflecting surface of the reflective element are conjugate planes, so that further information additional to the pin hole occluder can be imaged into the microscope image plane.

Photometer for use with a microscope

A stage for a microscope comprises a stage carrier, an object stage, an intermediate carrier disposed between the stage carrier and the object stage, and first and second displacement means. The first displacement means serves to displace the intermediate carrier together with the object stage in a first direction relative to the stage carrier, and the second displacement means serves to displace the object stage in a second direction substantially transverse to the first direction. The first and second displacement means are fixed relative to the stage carrier so that they do not move when the intermediate carrier and the object stage moves.

Stage for a microscope

To allow rapid change between the conoscopic observation method and the orthoscopic observation method in a microscope, while showing a small overall size and permitting and optically correct position of the Bertrand lens and the associated diaphragm, an additional supplementary beam path can be selectively used in addition to the main beam path. The supplementary beam path includes the Bertrand lens and the iris diaphragm and extends away from the optical axis of the microscope objective in a lateral direction.

Optical arrangement for microscopes

In a microscope possessing an adjustable-inclination viewing tube and optical path system for erecting the image, an optical component forming part of the erecting system can be interchanged with another optical component. It is thus possible to select, at will, either a totally reflecting optical component, or an optical component which splits the beam into two, the latter optical component being usable for the purpose of attaching the microscope to a photographic device or similar accessory.

Inclinable microscope body

In a microscope possessing an adjustable-inclination binocular unit and an optical path system for erecting the image, these two subsystems possess a common splitting prism, thus shortening the overall optical path in the microscope, so that the space required for the optical components remains small. This is of particular importance in cases involving microscope objectives which are corrected to infinity.

Tilting microscope binocular body

A microscope has a support structure which comprises a base, an upright portion, a cross-head and an objective-turret assembly mounted on an underside of the cross-head. The cross-head is mounted on the upright portion and contains principal components for forming an image. The upright portion and the cross-head define a generally planar division therebetween, whereby a generally planar gas-tight seal can be provided between the upright portion and cross-head. This enables the upright portion and the base to be disposed in a gas-tight chamber while the cross-head is located outside the chamber.

Microscope for observing environmentally sensitive objects

A drafting apparatus, or macrophotography attachment, for a microscope of the inverted type, the apparatus being arranged to provide an erect and laterally non-reversed image of an object on a drawing-surface, and in the observation plane, or an erect and laterally non-reversed image of a drawing or object at the observation and film planes of a microscope.

Drafting and macrophotography attachment for a microscope of the

A marking image control system for a microscope arrangement in which the image of a marking on a mask is reflected into the optical path and combined with an object image of the microscope, the system forming an intermediate image of the marking in order to facilitate shifting of the image of the marking in a film plane or a viewing plane of the microscope.

System for reflecting an image into a microscope

In an optical deflecting device with an optical bridge and with two optical sub-units which can be rotated relative to the optical bridge, the optical sub-units are, in the datum position, aligned in a manner such that the optical entrance axis of the first optical sub-unit is substantially perpendicular to the optical exit axis of the second optical sub-unit and substantially parallel to the optical axis of the optical bridge. This arrangement enables a light beam to be deflected without altering the orientation of the image.

Optical deflecting device

A magnetic coupling comprises two parts of an optical instrument, for example, of a microscope, which are to be releasably coupled together. A locating surface is formed on one part, this surface comprising one or more areas defined by bodies composed of a magnetic material which are spaced apart at intervals, the other part comprising a locating surface comprising areas defined by bodies composed of a material which can be magnetized. In order to avoid mechanical shocks caused by a powerful magnetic attraction as the parts are coupled, the material which can be magnetized, and which is associated with one of the locating surfaces, is confined to one or more areas of this surface, the arrangement of these areas corresponding to that of the areas on the locating surface. Other parts of the locating surface are composed of a material which cannot be magnetized. The coupling operation is carried out, firstly, by offering up one of the parts in an opposed position in which position no magnetic attraction is effective. The two parts are rotated, relative to one another when they have contacted each other, thus effecting the overlapping of the magnetic areas with the areas which can be magnetized, and thereby effecting coupling.

Magnetic coupling for parts of an optical instrument

Refractive characteristics of the eye or eyes of a microscopist can result in an unfocused image in the film plane of a camera attachment if accommodation occurs in the objective focusing system and an unfocus image can be prevented by providing a separate image for adjustment of the eyepiece or eyepieces to accommodate refractive characteristics of the eye or eyes of the microscopist independent of the object focusing mechanism.

Microscope eye piece focusing apparatus for use in producing sharp

By using two or more masks in a microscope having an optical system with an intermediate image plane therein in combination with a camera, composite photomicrographs can be prepared with two or more images.

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Vienna, Austria

Klaus P Schindl