Koninklijke Philips Corporation N.v.

Koninklijke Philips Electronics N.v.

Philips Intellectual Property & Standards Gmbh

Philips Gmbh

Klaus Jürgen Engel

Christoph Herrmann

Roger Steadman Booker

Thomas Koehler

Roland Proksa

Ewald Roessl

Gereon Vogtmeier

Rolf Karl Otto Behling

Lester Donald Miller

Jens Wiegert

Christian Baeumer

Guenter Zeitler

Johannes Wilhelmus Maria Jacobs

Bernd Menser

Eric Cornelis Egbertus Van Grunsven

Ewald Rössl

Fred Simon Berend Van Nijnatten

Bastiaan Feddes

Nishant Singh

Franz Josef Pfeiffer

Albert Garcia I Tormo

Theresa Urban

François Cornelius Johannes Van Daal

Ira Micah Blevis

Helko Lehmann

Frank Verbakel

Antonius Johannes Maria Nellissen

Norbert Conrads

Olivier Ecabert

Gerhardus Johannes Wissink

Rainer Kiewitt

Jörg Bredno

Christian Bäumer

Steffen Gunther Hohmann

Dieter Geller

Herfried Karl Wieczorek

The disclosure relates to an X-ray imaging system for acquiring two-dimensional or three-dimensional images of a subject. A relative position of an X-ray emitting region, as seen in a coordinate system which is stationary relative to an anti-scatter arrangement and/or an X-ray sensitive surface is controlled so that a first and a second image are acquired at different relative positions of the X-ray emitting region relative to the anti-scatter arrangement and/or the X-ray sensitive surface (). A data processing system of the imaging system generates an output image, based on each of the images. In the output image, artefacts generated by the anti-scatter arrangement, are reduced, suppressed or eliminated compared to the first and the second image.

X-ray imaging systems for reducing artefacts associated with anti-scatter grids and methods of operating the same

The present invention relates to an apparatus () for processing of data acquired by a dark-field and/or phase contrast X-ray imaging system, the apparatus comprising an input unit (), and a processing unit (). The input unit is configured to provide the processing unit with blank scan fringe data acquired by a dark-field and/or phase contrast X-ray imaging system comprising an interferometry arrangement and detector. The input unit is configured to provide the processing unit with sample scan fringe data acquired by the dark-field and/or phase contrast X-ray imaging system, with an object to be imaged is positioned within the dark-field and/or phase contrast X-ray imaging system. The processing unit is configured to pre-process the blank scan fringe data to determine pre- processed blank scan fringe data comprising utilization of an effective point spread function 'PSF'. The processing unit is configured to pre-process the sample scan fringe data to determine pre- processed sample scan fringe data, comprising utilization of the effective point spread function 'PSF'. The effective PSF has been determined for the dark-field and/ or phase contrast X-ray imaging system.

Apparatus for processing data acquired by a dark-field and/or phase contrast X-ray imaging system

The present invention relates to an apparatus for determining an effective energy spectrum of an X-ray tube. It is described to provide () a temporally varying acceleration voltage of an X-ray tube for a time period. A temporally varying X-ray tube current is also provided () for the time period. At least one product of the temporally varying X-ray tube current and a time interval is determined (). An effective energy spectrum of the X-ray tube processing the X-ray tube is determined () as a function of the at least one product of the temporally varying X-ray tube current and the time interval and as a function of the voltage of the X-ray tube.

Apparatus for determining an effective energy spectrum of an X-ray tube

An X-ray imaging system for generating X-ray projections of an object, the X-ray imaging system including an X-ray device having a single X-ray source () for forming a plurality of X-ray beams (), a filter () positioned within the plurality of X-ray beams, an object space where the object to be imaged is accommodated, and an X-ray detector () including an array of a plurality of pixels (). The X-ray device, the filter, and the plurality of pixels are configured such that at least one pixel is exposed to the plurality of X-ray beams. X-ray radiation received by a particular pixel undergoes a same spectral filtration by the filter. Pixels receiving the X-ray radiation undergoing the same spectral filtration are summarized to a pixel subset.

Systems and methods for grating modulation of a spectra and intensity in computed tomography

The present invention relates to a detector (') for detecting ionizing radiation, comprising: a directly converting semi-conductor layer () for producing charge carriers in response to incident ionizing radiation; and a plurality of electrodes () corresponding to pixels for registering the charge carriers and generate a signal corresponding to registered charge carriers; wherein an electrode of the plurality of electrodes () is structured to two-dimensionally intertwine with at least two adjacent electrodes to register the charge carriers by said electrode and by at least one adjacent electrode. The present invention further relates to a detection method and to an imaging apparatus.

Detector and method for detecting ionizing radiation

The invention relates to a radiation detector (), particularly an X-ray detector, which comprises at least one sensitive layer () for the conversion of incident photons (X) into electrical signals. A two-dimensional array of electrodes () is located on the front side of the sensitive layer (), while its back side carries a counter-electrode (). The size of the electrodes () may vary in radiation direction (y) for adapting the counting workload of the electrodes. Moreover, the position of the electrodes () with respect to the radiation direction (y) provides information about the energy of the detected photons (X).

Radiation detector with multiple electrodes on a sensitive layer

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Veldhoven, Netherlands

Klaus Jürgen Engel