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Jpk Instruments Ag

Klaus Dreisewerd

Detlef Knebel

Matthias W Amrein

Jens Soltwisch

Christoph Hauke Manfred Bookmeyer

Disclosed is a device to generate ions from a deposited sample, comprising: A chamber which is arranged and designed to keep the deposited sample in a conditioned environment comprising a dopant gas, A desorption device which is arranged and designed to desorb the deposited sample in the chamber using an energy burst, An ionization device which, for the purpose of ionization, is arranged and designed to irradiate the desorbed sample in the chamber using coherent electromagnetic waves or expose it to an electric discharge, a plasma, or light of an arc discharge lamp with broadband emission spectrum, which are chosen such that the dopant gas is receptive to them, and An extraction device which is arranged and designed to extract ions from the desorbed sample and transfer them into an analyzer. Disclosed is also a method which is preferably conducted on such a device.

Desorption ion source with dopant-gas assisted ionization

The invention relates to a combined method in which a high-resolution image of a sample surface is recorded by means of scanning force microscopy and the locally high-resolution, chemical nature (which is correlated with this) of the sample surface is measured by means of mass spectroscopy. The surface is chemically analyzed on the basis of laser desorption of a restricted surface area. For this purpose, the surface is illuminated in a pulsed form at each point of interest using the optical near-field principle. The optical near-field principle guarantees analysis with a position resolution which is not diffraction-limited. A hollow tip of the measurement probe that is used allows unambiguous association between the chemical analysis and a selected surface area. The highly symmetrical arrangement allows good transmission of the molecular ions that are produced.

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Münster, Germany

Klaus Dreisewerd