Growing community of inventors

Tokyo, Japan

Kiyotaka Ichiyama

Average Co-Inventor Count = 2.20

ph-index = 4

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 60

Kiyotaka IchiyamaMasahiro Ishida (29 patents)Kiyotaka IchiyamaTakahiro Yamaguchi (17 patents)Kiyotaka IchiyamaMani Soma (3 patents)Kiyotaka IchiyamaYasuhide Kuramochi (2 patents)Kiyotaka IchiyamaDaisuke Watanabe (1 patent)Kiyotaka IchiyamaToshiyuki Okayasu (1 patent)Kiyotaka IchiyamaKiyotaka Ichiyama (33 patents)Masahiro IshidaMasahiro Ishida (269 patents)Takahiro YamaguchiTakahiro Yamaguchi (141 patents)Mani SomaMani Soma (37 patents)Yasuhide KuramochiYasuhide Kuramochi (23 patents)Daisuke WatanabeDaisuke Watanabe (141 patents)Toshiyuki OkayasuToshiyuki Okayasu (118 patents)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Adv Antest Corporation (33 from 2,253 patents)


33 patents:

1. 11005463 - Signal processor and signal processing method

2. 9151801 - Measurement circuit and test apparatus

3. 8896332 - Test apparatus with voltage margin test

4. 8659330 - Signal generation apparatus and signal generation method

5. 8271219 - Deterministic component model identifying apparatus, identifying method, program, recording medium, test system and electronic device

6. 8204165 - Jitter measurement apparatus, electronic device, and test apparatus

7. 8175828 - Evaluation apparatus, evaluation method, program, recording medium and electronic device

8. 8155215 - Transmission system, transmitter, receiver, and transmission method

9. 8068538 - Jitter measuring apparatus, jitter measuring method and test apparatus

10. 8045605 - Jitter amplifier circuit, signal generation circuit, semiconductor chip, and test apparatus

11. 8014465 - Digital modulator, digital modulating method, digital transceiver system, and testing apparatus

12. 8000931 - Deterministic component model judging apparatus, judging method, program, recording medium, test system and electronic device

13. 7999531 - Phase detecting apparatus, test apparatus and adjusting method

14. 7971107 - Calculation apparatus, calculation method, program, recording medium, test system and electronic device

15. 7957458 - Jitter measurement apparatus, jitter measurement method, test apparatus and electronic device

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12/5/2025
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