Shimadzu Corporation

Kiyoshi Wada

Kenji Nakamura

Katsuhiko Ichimura

Takahiro Tajima

Hiroshi Yamamoto

Tomiyuki Maeda

An infrared spectrophotometer, which is capable of preventing measurement data measured from being adversely affected by moisture vapor. An internal space of an attachment receiving therein an optical element is sealed and isolated from ambient air by providing a tube and others, and a dehumidifier is provided in the internal space of the attachment for an optical path. Thus, the dehumidifier is disposed in a relatively narrow space, so that the internal space of the attachment can be efficiently dehumidified within a short period of time so as to reduce humidity in the internal space to suppress absorption of moisture vapor which would otherwise occur on the optical path in the internal space of the attachment. This makes it possible to prevent a negative influence of moisture vapor on measurement data, while reducing a standby time due to the dehumidification.

Infrared spectrophotometer and auxiliary device therefor

Methods of conducting Thin Layer Chromatography (TLC) involving using a TLC plate having sample spots and including no support material, placing the TLC plate on a porous substrate, and allowing solvent to move upwardly from the porous substrate toward the TLC plate by capillary action to be vaporized from the surface of the TLC plate, thereby concentrating the sample spots developed in the thin layer on the surface of the TLC plate.

Growing community of inventors

Uji, Japan

Kiyoshi Wada