Ando Electric Company

Dai Nippon Printing Co., Ltd.

Nippon Shokubai Co., Ltd.

Mitsui Chemicals, Inc.

Kiyoshi Ito

Takeshi Fukuda

Shinji Hayashi

Shunsuke Sega

Kenichi Ueda

Tomonobu Sumino

Masahiro Tatsuzawa

Tomomasa Kaneko

Minoru Yamaguchi

Teruo Arii

Hiroko Shibamoto

Provided is an alkali-soluble maleimide-based copolymer which comprises, as essential constituents, 5 to 50% by mass of a maleimide monomer unit which is at least one unit selected from the group consisting of a N-cyclohexylmaleimide monomer unit, a N-benzylmaleimide monomer unit and a substituted N-benzylmaleimide monomer unit, 8 to 30% by mass of the (meth)acrylic acid monomer unit and 30 to 87% by mass of a (meth)acrylic acid ester monomer unit and which satisfies the condition represented by the formula:0.4&#xd7;0.5&#xd7;10where X is the content, in % by mass, of the N-cyclohexylmaleimide monomer unit, the N-benzylmaleimide monomer unit and the substituted N-benzylmaleimide monomer unit and Y is the content, in % by mass, of the (meth)acrylic acid monomer unit. Also provided are a color filter and a liquid crystal display which are formed by using the ionizing radiation-curable resin composition.

Alkali-soluble maleimide copolymer and liquid crystal display comprising the same

An integrated circuit testing apparatus includes a control section including a memory for storing the plurality of testing programs corresponding to the plurality of tests, and a transfer control unit for transferring the plurality of testing programs on the basis of an control command; and an IC testing section including a ROM in which the testing programs transferred from the transfer control means are stored, a RAM in which the test results are temporarily stored, and a processing unit for temporarily storing the test results in the RAM whenever execution of each testing program has been completed, synthesizing all the test results when execution of all the testing programs have been completed to set a final test result for each device to be tested, and sending the final result to the automatic sorter

Method and apparatus for testing integrated circuit

A signal is generated according to the waveform information designated by a program and outputted by the format channels and . Skew correction circuits to are provided corresponding to the format channel and , and the signal outputted from the corresponding format channel is used as the reference, and the skew of the signal outputted from the other format channel is corrected. Logical add circuits to are provided corresponding to the skew correction circuits to , and compose the signal from the corresponding skew correction circuit and the signal from the format channel to which this skew correction circuit corresponds.

Signal generation circuit of semiconductor testing apparatus

A method of testing ICs in parallel is capable of receiving a state signal from handlers to estimate process start times of the handlers, and of changing a test start request interruption wait time. Automatic carriages automatically supply and accommodate IC issue test start request interruption signals to an external device control circuit of an IC tester. IC testing stations execute tests of ICs at the same time. When the test start request interruption signals are not issued from all the automatic carriages, a computer of the IC tester reads an operating state of the automatic carriages which do not issue the test start request interruption signal so as to judge whether the automatic carriage is in a significant wait condition. The IC testing stations immediately execute the test of ICs if the automatic carriages are not in the significant state. The computer calculates an optimal wait time if the automatic carriage is in the significant state, and the IC testing stations execute the test at the time when the optimal wait time lapses.

Method of reducing a measuring time during an automatic measurement of

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Tokyo, Japan

Kiyoshi Ito