Hitachi, Ltd.

Kiyokazu Arai

Akira Yamagiwa

Toshihiro Okabe

Masatoshi Kawashima

Syun Ishiyama

A data processing apparatus, including a number of electronic circuit units, in which high-speed data can be transmitted among the electronic circuit units. When data is transmitted from one electronic circuit unit to another electronic circuit unit, a clock signal to fetch the data in the sink side electronic circuit unit is transmitted from the source side electronic circuit unit via a clock signal line having the same signal propagation delay characteristics as those of the data signal line.

System for connecting plurality of electronic units to data and clock

A method for wiring a power supply for a large-scale integrated circuit. The power supply wires define a power supply grid surrounding lattice openings with fixed longitudinal and transverse lattice dimensions. The wire width is determined based on the integrated circuit chip size, the number of function circuits to be on the integrated circuit, the electrical power requirements of the function circuits, and the fixed longitudinal and transverse lattice dimensions. Longitudinal and transverse locations of the power supply wires chips are determined based on the determined wire width and the fixed longitudinal and transverse dimensions of the lattice openings. Alternatively, the wire width may be fixed and the dimensions of the lattice openings determined based on the integrated circuit chip size, the number of function circuits, the electrical power requirements of the function circuits and that wire width. When the electrical power requirement of a function circuit is significantly larger than that of another function circuit, the wire width may be increased in the vicinity of the one function circuit. When the function circuits include a large-scale function block, a wire width around a region of the integrated circuit chip in which the large-scale block is to be disposed may be selected which results in a wire area equal to the wire area of the power supply wire that would occupy the particular region for usual function circuits.

Method of wiring for power supply to large-scale integrated circuit

The invention prepares test data on a logic LSI which includes a plurality of signal pins, a control pin for inputting an external control signal, and control circuitry responsive to the external control signal for setting the signal pins in a desired state according to a specified function thereof. In accordance with the invention, the method comprises the steps of storing first data in a first memory, the first data being representative of a specified function of individual pins; storing the second data in a second memory, the second data representing a plurality of pin states corresponding to a plurality of signal states set by the external control signal; reading first and second data from the first and second memory; selectively communicating the test control signal to the integrated circuit, generating third data representative of each pin state of individual pins of each signal state set by the external control signal; and storing the third data into a file as test data.

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Hadano, Japan

Kiyokazu Arai