Samsung Electronics Co., Ltd.

Kitak Kim

Kiseok Bae

Jinsu Hyun

Ji-su Kang

Sang-wook Park

Mi-jung Noh

Jonghoon Shin

Kyoungmoon Ahn

Yong-ki Lee

Karpinskyy Bohdan

Yun-hyeok Choi

Yong-Soo Kim

A method for patching a patchable function programmed in a read only memory (ROM) of a semiconductor device by using firmware loaded onto a first memory includes receiving an encrypted and digitally signed firmware image; generating a verification result by verifying the firmware image by using a public key; decrypting the firmware image by using a secret key depending on the verification result; loading firmware decrypted from the firmware image onto the first memory; and running a replacement function corresponding to an identifier of the patchable function included in the firmware, when the patchable function is called.

Semiconductor device including secure patchable ROM and patch method thereof

An authentication apparatus, included in a device supporting a network communication, includes a certificate handler that receives a certificate of an opponent and parses or verifies the certificate of the opponent. Cryptographic primitives receive an authentication request of the opponent, generate a random number in response to the authentication request, generate a challenge corresponding to the random number, and verify a response of the opponent corresponding to the challenge. A shared memory stores the parsed certificate, the random number, the challenge, and the response. An authentication controller controls the certificate handler, the cryptographic primitives, and the shared memory through a register setting, according to an authentication protocol.

Authentication apparatus based on public key cryptosystem, mobile device having the same and authentication method

An apparatus for testing a random number generator includes a correlation test circuit and a randomness determination circuit. The correlation test circuit extracts a first plurality of bit pairs each including two bits spaced apart from each other by a first distance in a bit stream generated by the random number generator, obtains a first sum of differences between respective two bits of the first plurality of bit pairs, and obtains a second sum of differences between respective two bits of a second plurality of bit pairs, the second plurality of bit pairs each including two bits spaced apart from each other by a second distance, different from the first distance, in the bit stream. The randomness determination circuit determines a randomness of the bit stream, based on the first sum and the second sum.

Randomness test apparatus and method for random number generator

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Yongin-si, South Korea

Kitak Kim