Synopsys, Inc.

Kishore Singhal

Victor Moroz

Dipankar Pramanik

Xi-Wei Lin

Baribrata Biswas

Goetz Leonhardt

Mahmoud Shahram

Beifang Qiu

Byungwook Kim

Sergey Krasnovsky

Alex Gyure

Edhi Sutjahjo

An automated method for compensating for process-induced variations in threshold voltage and drive current in a MOSFET integrated circuit. The method's first step is selecting a transistor for analysis from the array. The method loops among the transistors of the array as desired. Next the design of the selected transistor is analyzed, including the steps of determining threshold voltage variations induced by layout neighborhood; determining drive current variations induced by layout neighborhood. The method then proceeds by attempting to compensate for any determined variations by varying the length of the transistor gate. The method can further include the step of identifying any shortcoming in compensation by varying contact spacing.

Method for compensation of process-induced performance variation in a MOSFET integrated circuit

One embodiment of the present invention provides a system for determining an electrical property for an interconnect layer. During operation, the system receives interconnect technology data which includes nominal parameter values for a first interconnect layer, and parameter-variation values which represent variations in the nominal parameter values due to random process variations. Next, the system receives an interconnect template which describes the geometry of a portion of a second interconnect layer. The system then determines electrical property data for the interconnect template using the interconnect technology data. The electrical property data can include a nominal electrical property value, and sensitivity values which represent the sensitivities of the nominal electrical property value to variations in the nominal parameter values. Next, the system stores the electrical property data and the interconnect technology data in a storage.

Method and apparatus for facilitating variation-aware parasitic extraction

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Milpitas, CA, United States of America

Kishore Singhal