Texas Instruments Corporation

Kiran Rajmohan

Sandeep Kesrimal Oswal

Jagannathan Venkataraman

Anand Hariraj Udupa

Hussam Ahmed

Prabin Krishna Yadav

Kalyan Chakravarthi Chekuri

Anand Reghunathan

A test system and interface circuitry for antenna-free bit error rate testing of an electronic device under test, including a pulse shaping circuit with a pulse shaping filter circuit to pulse shape a modulating signal before amplitude modulation with a carrier signal, and the amplitude modulated signal is coupled directly or via a transformer and a socket to the device under test without antennas to facilitate automated device testing with simple reconfiguration of signal generators for different device type. A method includes filtering a square wave modulating signal to create a pulse shaped modulating signal, amplitude modulating a carrier signal with the pulse shaped modulating signal to create an amplitude modulated signal, providing the amplitude modulated signal to the socket, and evaluating a bit error rate of the DUT according to receive data from the DUT and according to the BER test transmit data.

Antenna-free receiver bit error rate testing

A system may comprise: an excitation current source; a first electrode coupled to the excitation current source; and a second electrode coupled to the excitation current source. The first and second electrodes may be configured to pass an excitation current from the excitation current source through a human body. First and second calibration resistors may be coupled to and positioned between the excitation current source and the first electrode. Third and fourth calibration resistors may be coupled to and positioned between the excitation current source and the second electrode. The system may also comprise a sensor configured to measure voltages across each of the first, second, third, and fourth calibration resistors.

Calibrating body impedance measurement systems

Growing community of inventors

Ernakulam, India

Kiran Rajmohan