Honeywell International Inc.

Kiran N

Ramakrishnan Ganapathi

Abhishek Nikhra

Manas Dutta

Ravi Kumar R

Avinash Rajan

A method of detecting and tracking changes in engineering configuration data (ECD) for control and instrumentation (C&I) systems an industrial facility. First ECD in a first data format used in a first C&I system and second ECD in a second data format used in a second C&I system are converted into a common format. The first and second ECD are stored together as reference snapshot data with a timestamp in a single information source. At a second time, after the first time reflected in the timestamp, the first and second ECD are obtained. The first ECD and the second ECD obtained at the second time are converted into the common format that collectively provides updated snapshot data. Changes are detected between the first ECD and the second ECD by comparing the reference snapshot data to the updated snapshot data.

Detecting and tracking changes in engineering configuration data

A system and method of engineering configuration data (ECD) collection for an industrial facility having a first control and instrumentation (C&I) system with first ECD using a first file format and a second C&I system with second ECD data using a second file format, and a data collection server. A first data agent has collection information regarding the first C&I system and a second data agent has collection information regarding the second C&I system. The first data agent collects the first ECD and the second data agent collects the second ECD. The first ECD and the second ECD are translated into one common generic data format. The first ECD and the second ECD are stored after being translated.

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Karnataka, India

Kiran N