Qualcomm Incorporated

Kiran Kumar Malipeddi

Rahul Gulati

Kunal Mukesh Desai

Pranav Agrawal

Shekar Babu Merla

Various embodiments include components (e.g., a processor in a vehicle advanced driver assistance system) configured to identify subsystems that require testing in order to verify their compliance with a safety requirement. The components may determine whether verification of compliance requires that the subsystems be tested at PON, at POFF, during runtime or a combination thereof, dynamically determine the achievable parallelism for testing the identified subsystems, dynamically determine coverage level requirements for performing or executing built in self tests (BISTs) on each identified subsystem, and perform or execute the BISTs on the subsystems at the determined level of parallel and at the determined coverage level.

Dynamically re-configurable in-field self-test capability for automotive systems

Various embodiments may include methods and systems for reconfiguring memory channel routing within a system-on-a-chip (SoC). A method may include obtaining first error information in response to misbehavior in a first memory channel communicatively connected to a network interface unit (NIU) of the SoC. The method may further include storing the first error information in non-volatile memory that is read upon booting of the SoC, and rebooting the SoC including the first memory channel. The method may further include configuring the first memory channel to be communicatively disconnected from the NIU and configuring a second memory channel to be communicatively connected to the NIU in response to reading the stored first error information during reboot.

Growing community of inventors

San Diego, CA, United States of America

Kiran Kumar Malipeddi