Marvell International Limited

Kiran Joshi

Manish Shrivastava

Devices, systems, methods, and other embodiments associated with generating a moving average are described. In one embodiment, a method includes inputting a new data value, wherein the new data value is a most recent data value in a series of M prior sequential data values that are input to an accumulator for the purpose of calculating a moving average having a window size of M. The method also includes detecting an error in the new data value and correcting the moving average, based at least in part, on the error.

Generating a moving average

Devices, systems, methods, and other embodiments associated with generating a moving average are described. In one embodiment, a method calculates, using at least an accumulator, an average value of M sequential data values is calculated, where M is an integer. The M sequential data values are delayed before passing a delay output. The method detects a data value with an error in the M sequential data values that are delayed and controls the accumulator to correct the average value of the M sequential data values as a function of the error.

A non-fighting fully clocked scan latch is described that is dynamically configurable to support both logic data latching and scan data latching. The described scan latch circuit design reduces a load placed on a logic data latch portion of the described circuit by a scan latch portion of the described circuit, and thereby increases the speed of the described scan latch to that of an output latch without scan capability. Power required to drive the described scan latch is reduced by clocking the circuit to avoid fighting and by reducing the number of transistors included in transistor stacks internal to the scan latch. By reducing drive power requirements, eliminating internal latch fighting, and increasing latch response, a versatile scan latch is achieved that may be successfully implemented in a wide range of circuits despite the use of different supply drive voltage, threshold voltage, source-to-drain voltage, and transistor technology combinations.

Scan architecture for full custom blocks with improved scan latch

Devices, systems, methods, and other embodiments associated with generating a moving average are described. In one example method an average value of a sliding window of M sequential data values is calculated on a per clock basis, where M is an integer. A data value is detected that has an error. The data value is in the sliding window of M sequential data values. The method corrects the average value of the sliding window as a function of the error.

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Mountain View, CA, United States of America

Kiran Joshi