Photon Dynamics, Inc.

Kiran Jitendra

Kent Nguyen

Yan Wang

Kaushal Gangakhedkar

David L Baldwin

Nile Alexander Light

Thomas H Bailey

Gordon Yue

Steve Aochi

Atila Ersahin

Neil Dang Nguyen

Hai Tran

Alan Cable

Lloyd Russell Jones

Dave Smiley

Steven Aochi

Thomas E Wishard

A probe system for facilitating inspection of a device under test comprising a plurality of panels, the probe system incorporating: a configurable universal probe bar comprising a plurality of probe blocks, the plurality of probe blocks comprising a plurality of probe pins positioned to simultaneously electrically engage a plurality of cell contact pads of the plurality of panels of the device under test to deliver a plurality of electrical test signals; and an alignment system configured to achieve an alignment of the plurality of probe pins with the plurality of the cell contact pads of the plurality of panels of the device under test.

Systems and methods for electrical inspection of flat panel displays using cell contact probing pads

A probe system for facilitating the inspection of a device under test. System incorporates a storage rack; a probe bar gantry assembly; a probe assembly configured to electrically mate the device under test; and a robot system for picking the probe assembly from the storage rack and deliver the probe assembly to the probe bar gantry. The robot system is also enabled to pick a probe assembly from the probe bar gantry and deliver the probe assembly to the storage rack. The probe assembly includes a clamping assembly for attaching the probe assembly to the probe bar gantry or the storage rack. The probe assembly may include an array of contact pins configured to mate with conductive pads on the device under test when the probe assembly is installed on the probe bar gantry assembly.

Automatic probe configuration station and method therefor

Growing community of inventors

San Jose, CA, United States of America

Kiran Jitendra