Horiba, Ltd.

Horiba Advanced Techno, Co., Ltd.

Hitachi-kokusai Electric Inc.

Kimihiko Arimoto

Yoko Nakai

So Takagi

Yoshihiro Mori

Hideto Tateno

Akinori Tanaka

Issei Yokoyama

Kazuhiro Miyamura

Kazuya Nakagawa

Takuji Kurozumi

Takaaki Yada

Yoshito Komada

Shintaro Komatani

Yuiji Tsujioka

Nobuyuki Naka

Yoshiyuki Nakajima

Makoto Matsuhama

Tomoko Seko

Sumito Ohzawa

Akihiro Katanishi

Hiroki Minowa

Satoru Goto

Hideki Nakayama

Yusuke Awane

Takuya Onoda

Issei Kobayashi

Yutaka Dejima

Tatsuya Nakahara

Kunio Ohtsuki

Masaaki Magari

Hirotaka Iseki

Shintaro Masuda

Keigo Sakamoto

Kohei Hara

Daisuke Kitaki

Mayuko Kishida

Takashi Kinba

To accurately measure chromaticity and turbidity while achieving downsizing and employing a turbidity measurement method based on water quality standards of each country, an optical measurement includes a cell that accommodates a liquid sample, a transmitted light measurement light source that irradiates the liquid sample in the cell with light for transmittance, a scattered light measurement light source that irradiates the liquid sample in the cell with light for scattering, a photodetector that detects light from both sources, and a reflection mirror that reflects the light for transmittance in the cell to cause the light for transmittance to be directed to the photodetector. The scattered light measurement light source emits the light for scattering toward a post-reflection optical path of the light for transmittance reflected by the reflection mirror and directed to the photodetector so that the light for scattering intersects the post-reflection optical path at a predetermined angle.

Optical measurement device and water quality analysis system

The present invention relates to a semiconductor laser device capable of reducing a measurement error of a temperature detecting element for detecting the temperature of a semiconductor laser element and accurately controlling the temperature of the semiconductor laser element. The semiconductor laser device is used for optical analysis and includes: a semiconductor laser element; a temperature detecting element that detects the temperature of the semiconductor laser element; output terminals that output the output of the temperature detecting element to the outside; wires that electrically connect the temperature detecting element and the output terminals; and a heat capacity increasing part that is provided interposed between the temperature detecting element and output terminal, and the output terminal, and contacts with at least part of the wires to increase the heat capacity of the wires.

Semiconductor laser device and analysis apparatus

The present invention is one that intends to achieve improvements in both analysis efficiency and analysis accuracy without difficulty, and a biological substance analysis device that analyzes light derived from a biological substance in a sample, and the biological substance analysis device includes: a holder that holds multiple containers containing the sample; a photodetector that is fixed at a predetermined position; a holder driving mechanism that moves the holder to position each of the containers held in the holder at a detection position by the photodetector in sequence; and a light shielding mechanism that, while guiding light emitted from the sample in a container at the detection position to the photodetector, prevents light emitted from the sample in the other containers from being guided to the photodetector.

Biological sample analysis device

A reference electrode according to the present invention maintains continuity between an internal solution and measurement sample and measures the electrical potential of the measurement sample even if the measurement sample in a liquid junction of the reference electrode has air bubbles mixed therein. This reference electrode is provided with: a second body provided with a second internal solution chamber in which a second internal solution is housed and a liquid junction portion disposed in the second internal solution chamber such that the second internal solution and measurement sample that is to be measured come into contact; and an internal electrode disposed inside the second internal solution. The liquid junction portion is formed from a conduction component formed from a porous or fibrous component and an aperture adjacent to the conduction component.

Reference electrode

Gas sampling cell

In order to reduce a variation in the light amount of light detected in every reference measurement cycle in an absorption spectrometer, it is adapted to tilt at least one surface selected from among incident surfaces and emitting surfaces of all translucent members constituting a reference cell with respect to the light axis of light traveling along a light path.

Absorption spectrometer

This invention is to distinguish a position of a measurement cell without using a position sensor that is an electric component, and comprises a cell switching mechanism that switches a measurement position where the measurement cell is located on an optical path and an evacuating position where the measurement cell is evacuated from the optical path so as to make a first moving speed from the measurement position to the evacuating position different from a second moving speed from the evacuating position to the measurement position, and a distinguishing mechanism that detects speed information relating to the first moving speed and the second moving speed by the use of a measurement light and distinguishes the measurement position and the evacuating position.

Analyzing device

The present invention includes: an optical fiber being provided either of between a light source and a measurement cell and between the measurement cell and a light detection part; and light path switching means adapted to achieve switching between a measurement cell passage state in which a light path formed by light transmission means passes through the measurement cell and a measurement cell non-passage state in which the light path formed by the light transmission means passes through a region different from the measurement cell, wherein calibration processing for a first calibration with a long calibration cycle is performed in the measurement cell passage state, and calibration processing for a second calibration with a short calibration cycle is performed in the measurement cell non-passage state.

Optical analyzer

An optical measurement device is adapted to measure characteristics of a measurement targeted fluid based on a transmitted inspection light. The device comprises a cell having an internal space for accommodating the measurement targeted fluid to flow therein and having a pair of opposing through holes for transmitting the inspection light, each of the through holes sealed with a transparent member. The device includes a projection optical system member having a port for projecting the inspection light and a light-receiving optical system member having a port for receiving the inspection light transmitted through the internal space. A base member is provided for supporting the cell, the projection optical system member, and the light-receiving optical system member in a configuration with gaps between the cell and the respective optical system members to accommodate movement in a predetermined range along a direction perpendicular to an optical axis of the inspection light.

Optical measurement device

In a sample cell that is sealed with an X-ray transmission sheet after a sample such as a liquid fuel or the like is contained therein, when an internal pressure is increased, a cup end surface is deformed so as to increase an internal capacity of the sample cell before the X-ray transmission sheet serving as a window part is expanded. The cup end surface is formed by folding a film-like material and, when the internal pressure of the sample cell is increased, the cup end surface is unfolded outwardly of the sample cell to increase the internal capacity of the sample cell. The increase in pressure is relieved by the increase in capacity, and the expansion of the X-ray transmission sheet is thereby prevented.

Sample cell for fluorescent X-ray analysis and sample cell assembly instrument

To make it possible to alter a cell length with reduction of a manufacturing cost so that a spacer can be securely positioned at a desired position, a cell includes: a pair of optical windows sandwiching a flow channel; a cell body provided with an accommodating recess and a solution introduction part and a solution deriving part; a pair of light transmitting members in the accommodating recess and forming the pair of optical windows; a spacer defining a distance between the opposing surfaces of the pair of light transmitting members; and a pressing mechanism for pressing the light transmitting members and the spacer toward the bottom surface of the accommodating recess so as to form the flow channel, wherein a positioning recess having a shape corresponding to the spacer is provided on at least one of the opposing surfaces and the spacer is fitted therein.

Optical measurement cell

This invention is to make the detection sensitivities as even as possible among a plurality of specimens to be inspected in an analyzer that leads light transmitted from the plurality of specimens to be inspected to a single spectrometer via optical fibers, the analyzer includes first and second light guide members provided for every first and second specimen to be inspected so as to lead the light obtained from each of the specimens to be inspected to a photo-detecting part, and light projection side end portions of a plurality of optical fiber elements composing the first and second light guide members are arranged in mixture.

Analyzer

The present invention provides a method and substrate examining device that sequentially and automatically measures at least the thickness and the internal stress of the thin film at a predetermined measurement point on the surface of every manufactured semiconductor substrate to perform quality control on each substrate, and reliably recognizes the cause of defects to improve productivity. The examining device and method accurately analyzes the correlation between film thickness and stress to establish the manufacturing processes necessary for manufacturing a semiconductor substrate of higher performance, and measures the distribution of a physical quantity such as internal stress, index of refraction, and composition of the semiconductor substrate in the film thickness direction, without being influenced by change in ambient environmental temperature thereby further improving examination precision.

Substrate inspection apparatus and method

Growing community of inventors

Kyoto, Japan

Kimihiko Arimoto