Skhynix Inc.

Hynix Semiconductor Inc.

Hyundai Electronics Industries Co. Ltd.

Hyundai Electronics Industries

Kie-Bong Ku

Young-Hee Kim

Lee-Bum Lee

Sung-Hwa Ok

Hye-Young Lee

Se-Jin Yoo

Choung-Ki Song

Byung-Joo Kang

Young-Sung Han

Hong-June Park

Kyung-Won Kim

Jong-Tai Park

A semiconductor device includes a pipe latch suitable for sequentially latching data in response to a pipe input control signal and sequentially outputting data in response to a pipe output control signal, a pipe latch control unit suitable for generating the pipe input/output control signals in response to a command signal and latency information, and resetting the pipe input/output control signals in response to a pipe reset signal, and an error detection unit suitable for receiving the pipe input control signal and the pipe output control signal, detecting a latency error, and generating the pipe reset signal.

Semiconductor device and semiconductor system including the same

A semiconductor memory device includes a plurality of data input/output pads configured to transmit and receive data to and from memory cells, an alert pad configured to output data error information while the data is transmitted and received, and a monitoring device configured to output the data error information to the alert pad in a first mode and to output monitoring information to the alert pad in a second mode.

Monitoring device of integrated circuit

A semiconductor memory device includes a memory cell array including a normal region for storing a plurality of data, an error information region for storing a plurality of error information data corresponding to the plurality of normal data, respectively, and a redundancy region for replacing the normal region, an error detection unit suitable for detecting an error on the plurality of data in response to the plurality of error information data, and storing an error location information, which indicates a storage region of a data having an error in the normal and redundancy regions, based on an error detection result, and a repair operation unit suitable for replacing the storage region, which is indicated by the error location information, by the redundancy region during a repair operation period.

Semiconductor memory device and semiconductor system including the same

A semiconductor memory device includes a unit memory bank having a plurality of memory cell mats, which shares a local data line, and divided by a row address; and at least one dummy cell mat disposed between the plurality of memory cell mat.

Semiconductor memory device and semiconductor memory system

A method for testing a semiconductor device includes testing the semiconductor device in a plurality of operation modes sequentially, and programming the semiconductor device to operate in at least one of the operation modes when the semiconductor device passes the testing.

Method and system for testing semiconductor device

A semiconductor device includes a data bus inversion (DBI) decision unit suitable for deciding whether a DBI operation mode is performed, based on a read data, and generating a DBI decision signal corresponding to a result of the decision; an output control unit suitable for generating an arrangement control signal in which a delay amount of time for the decision is reflected, in a DBI operation mode; a data synchronization unit suitable for synchronizing the read data with the arrangement control signal and output the synchronized read data and inverted signals of the synchronized read data, in the DBI operation mode; and a data output unit suitable for selectively outputting the synchronized read data and the inverted signals of the synchronized read data, to an external in response to the DBI decision signal, the arrangement control signal and an output control signal, in the DBI operation mode.

Semiconductor device

A semiconductor device includes first and second bank groups coupled to first and second data lines which are electrically isolated from each other. The semiconductor device includes a register unit suitable for providing predetermined data to the second data line in a specific mode, a data transfer and output unit suitable for externally outputting the predetermined data loaded onto the second data line and simultaneously transferring the predetermined data to the first data line in the specific mode, and a data output unit suitable for externally outputting the predetermined data loaded onto the first data line in the specific mode.

A semiconductor memory device includes a compression unit configured to compress a plurality of data, which are read from a memory cell region based on successive read commands and addresses, and to successively output the compressed data during a first test mode, a latching unit configured to latch the compressed data in response to a read strobe signal and to fix the latched value when a fail is detected from the compressed data during the first test mode, and an output unit configured to output the latched value to the outside during a second test mode.

Semiconductor memory device and method for testing the same

An integrated circuit chip includes a test enable pad configured to receive a test enable signal, a plurality of test input pads including a reset pad, a signal combination unit configured to combine signals input to the plurality of test input pads when the test enable signal is activated, and to generate a plurality of test output signals, a plurality of test output pads configured to output the plurality of test output signals, and a reset control unit configured to generate a system reset signal using a signal input to the reset pad when the test enable signal is deactivated, and to generate the system reset signal using the test enable signal when the test enable signal is activated.

Integrated circuit chip and memory device

A semiconductor memory device and method for operating the same includes a controller configured to generate a data buffer control signal in a mode register set (MRS) mode, a data buffer configured to buffer and output a plurality of MRS codes inputted through a data pad in response to the data buffer control signal, and a plurality of MRS command generators configured to receive the MRS codes outputted from the data buffer through a data line and generate a plurality of MRS commands based on the received MRS codes.

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Gyeonggi-do, South Korea

Kie-Bong Ku