Samsung Electronics Co., Ltd.

Sungkyunkwan University

Kideok Bae

Changseung Lee

Hongseok Lee

Hoon Song

Seunghoon Han

Young Shin Kim

Wooyoung Yang

Kanghee Won

Yunhee Kim

Hyeonsoo Park

Jeongyub Lee

Hyunsung Park

Xianyu Wenxu

Eunhyoung Cho

Yongyoung Park

Yeonhee Kim

Heeju Kim

Jongwoo Hong

Geunyoung Yeom

Haesoo Bae

A meta-lens, an imaging optics, and an electronic device including the imaging optics are provided. The meta-lens includes at least one meta-layer having a plurality of nanostructures with a less shape dimension than an operating wavelength, modulates a phase and intensity of incident light, and forms a plurality of spots of different brightness on an imaging plane in an asymmetric distribution. The plurality of spots formed on the imaging plane include a main spot and at least one sub-spot that is separated from a center of the main spot and has lower illuminance than the main spot.

Meta-lens, imaging optics, and electronic device including the same

An optical thin film includes a support layer and a dielectric layer on the support layer. The dielectric layer has a refractive index greater than that of the support layer. The dielectric layer includes a compound ADX, which includes a Group 3 element A, a Group 5 element D, and an element X having an atomic weight smaller than an atomic weight of A or D. The optical thin film may exhibit light transmission having a high refractive index and low absorptivity.

Optical thin film for meta-surface and meta-optical device including the same

A liquid crystal light deflector includes a first electrode layer including a plurality of pattern electrodes arranged with a constant pitch in a first direction on a first substrate, a first alignment layer covering the first electrode layer and having a plurality of concave portions formed on an upper surface thereof and extending in parallel to a second direction perpendicular to the first direction, a liquid crystal layer including a plurality of liquid crystal molecules each having a long diameter substantially parallel to the concave portions on the first alignment layer, a second electrode layer, which is a common electrode, disposed on the liquid crystal layer, and a second substrate disposed on the second electrode layer.

Liquid crystal light deflector

A method of evaluating the quality of a thin film layer may include: forming the thin film layer on a substrate; applying a stress to the thin film layer; and evaluating the quality of the thin film layer. A device for evaluating the quality of the thin film layer may include a stress chamber for applying a stress to the thin film layer and a refractive index measuring unit for evaluating the quality of the thin film layer based on a rate of change of a refractive index.

Method and device for evaluating quality of thin film layer

Growing community of inventors

Seoul, South Korea

Kideok Bae