Sun Microsystems, Inc.

Kian Chong

Claude R Gauthier

Dean Liu

A mixed signal delay locked loop characterization technique for automatically characterizing a mixed signal delay locked loop is provided. The technique tests the mixed signal delay locked loop using a top-down approach in order to ensure the robustness of the mixed signal delay locked loop. Top-level testing involves testing the performance of the mixed signal delay locked loop in different process corners, and the results obtained from the top-level testing are then used to test sub-components of the mixed signal delay locked loop.

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Sunnyvale, CA, United States of America

Kian Chong